MA31753 Datasheet, PDF (29/30 Pages) Dynex Semiconductor – DMA Controller (DMAC) For An MA31750 System

RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to total dose radiation levels, each
wafer lot will be approved when all sample devices pass the
total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL STD 883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x10⁵ Rad(Si)
Transient Upset (Stored data loss)
1x10¹¹ Rad(Si)/sec
Transient Upset (Survivability)
>1x10¹² Rad(Si)/sec
Neutron Hardness (Function to specification) >1x10¹⁵ n/cm²
Single Event Upset**
<1x10^-10 Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 24: Radiation Hardness Parameters
MA31753
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