MA17501 Datasheet, PDF (27/35 Pages) Dynex Semiconductor – Radiation Hard MIL-STD-1750A Execution unit

MA17501
6.0 ABSOLUTE MAXIMUM RATINGS
Parameter
Supply Voltage
Input Voltage
Current Through Any Pin
Operating Temperature
Storage Temperature
Min
Max
-0.5
7
-0.3 V_DD+0.3
-20
+20
-55
125
-65
150
Table 5: Absolute Maximum Ratings
Units
V
V
mA
°C
°C
Note: Stresses above those listed may cause permanent
damage to the device. This is a stress rating only and
functional operation of the device at these conditions, or at
any other condition above those indicated in the operations
section of this specification, is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
7.0 DC ELECTRICAL CHARACTERISTICS
Symbol Parameter
Conditions
Total Dose Radiation Not
Exceeding 3x10⁵ Rad(Si)
Min Typ Max Units
V_DD
V_IHC
V_ILC
V_IHT
V_ILT
V_CH
V_CL
V_OHC
V_OLC
V_OHT
V_OLT
V_OHCLK
V_OLCLK
I_I
I_OZ
I_IPU
I_DDOP
I_DDST
Supply Voltage
CMOS Input High Voltage (Note 1)
CMOS Input Low Voltage (Note 1)
TTL Input High Voltage (Note 2)
TTL Input Low Voltage (Note 2)
OSC Input High Voltage (Note 6)
OSC Input Low Voltage (Note 6)
CMOS Output High Voltage (Note 1)
CMOS Output Low Voltage (Note 1)
TTL Output High Voltage (Note 2)
TTL Output Low Voltage (Note 2)
Clock Output High Voltage (Note 3)
Clock Output Low Voltage (Note 3)
Input Leakage Current (Note 4)
Output Leakage Current (Note 4)
TESTN Input Pullup Current (Note 5)
Operating Supply Current
Static Supply Current
V_SS = 0
-
-
-
-
-
-
I_OH = -1.4mA, V_DD = 4.5V
I_OL = 2mA, V_DD = 5.5V
I_OH = -1.4mA, V_DD = 4.5V
I_OH = -1.4mA, V_DD = 4.5V
I_OH = -12mA, V_DD = 4.5V
I_OL = 12mA, V_DD = 5.5V
V_DD = 5.5V, V_IN = 0V or 5.5V
V_DD = 5.5V, V_O = 0V or 5.5V
V_DD = 5.5V, TESTN = 0V
V_DD = 5.5V, OSC = 20MHz
V_DD = 5.5V, OSC = 0MHz
4.5 5.0 5.5
V
V_DD-1
-
-
V
-
-
V_SS+1
V
2.0
-
-
V
-
-
0.8
V
4.0
-
-
V
-
-
1.0
V
4.0
-
-
V
-
-
0.5
V
3.5
-
-
V
-
-
0.4
V
4.0
-
-
V
-
-
0.5
V
-
-
±10 µA
-
-
±50 µA
-
-150 -300 µA
-
25
35
mA
-
5
10
mA
Mil-Std-883, Method 5005, Subgroup 1, 2, 3.
Notes: 1. The following signals are CMOS compatible:
a) CMOS inputs: Microcode Bus, (M00-M19), TESTN, IRDYN and PIFN.
b) CMOS outputs: T1, OVIN, INTREN, SYSCLK1N, CLKPCN and CLK02N.
2. The following signals are TTL compatible:
a) TTL inputs: HOLDN, RESET, PAUSEN, RDYN and OSC.
b) TTL outputs: HOLDAKN and SYNCN.
c) TTL 3 state outputs: AS, DSN, M/ION, RD/WN and IN/OPN.
d) TTL 3 state I/O signals: Address/Data Bus (AD00-AD15).
3. The clock output pins, SYSCLK1N, SYNCLK, CLKPCN and CLK02N have a higher drive capability than the
standard outputs.
4. Worst case at T_A = +125°C, guaranteed but not tested at T_A = -55°C.
5. The TESTN input signal is used during chip test and has an integral pullup reistor. In normal operation TESTN is at
V_DD.
6. Guaranteed but not tested.
Table 6: Operating DC Electrical Characteristics
27/35