PALC22V10D_07 Datasheet, PDF (4/12 Pages) Cypress Semiconductor – Flash Erasable, Reprogrammable CMOS PAL® Device

PALC22V10D
Electrical Characteristics Over the Operating Range^[2]
Parameter
Description
Test Conditions
Min. Max. Unit
I_CC1
I_CC2[6]
Standby Power Supply
Current
Operating Power Supply
Current
V_CC = Max.,
V_IN = GND,
Outputs Open in
10, 15, 25 ns
7.5 ns
Unprogrammed De- 15, 25 ns
vice
10 ns
V_CC = Max., V_IL =
0V, V_IH = 3V,
Output Open, De-
10, 15, 25 ns
7.5 ns
vice Programmed 15, 25 ns
as a 10-Bit Counter,
f = 25 MHz
10 ns
Com’l
Com’l
Mil/Ind
Mil/Ind
Com’l
Com’l
Mil/Ind
Mil/Ind
90 mA
130 mA
120 mA
120 mA
110 mA
140 mA
130 mA
130 mA
Notes:
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V_IL (Min.) is equal to -3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V_OUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
Capacitance^[6]
Parameter
Description
C_IN
Input Capacitance
C_OUT
Output Capacitance
Endurance Characteristics^[6]
Test Conditions
V_IN = 2.0V @ f = 1 MHz
V_OUT = 2.0V @ f = 1 MHz
Min.
Max.
10
10
Unit
pF
pF
Parameter
Description
N
Minimum Reprogramming Cycles
Test Conditions
Normal Programming Conditions
Min.
100
Max.
Unit
Cycles
AC Test Loads and Waveforms
R1238 Ω
(319Ω MIL)
5V
OUTPUT
C_L
INCLUDING
JIG AND
SCOPE
(a)
R2170 Ω
(236Ω MIL)
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
R1238 Ω
(319Ω MIL)
5 pF
OUTPUT
R2170 Ω
(236Ω MIL)
(b)
750Ω
C_L
(1.2KΩ
MIL)
(c)
3.0V
GND
< 2 ns
ALL INPUT PULSES
90%
10%
90%
10%
< 2 ns
(d)
V10D–5
Equivalent to: THÉVENIN EQUIVALENT(Commercial)
Equivalent to: THÉVENIN EQUIVALENT(Military)
99Ω
OUTPUT
2.08V=V _thc
V10D–6
OUTPUT
136Ω
2.13V=V _thm
V10D–7
4