PALC22V10D_07 Datasheet, PDF (3/12 Pages) Cypress Semiconductor – Flash Erasable, Reprogrammable CMOS PAL® Device

PALC22V10D
Macrocell
C₁
C₀
Maximum Ratings
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V10D–4
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12).................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State .....................................................−0.5V to +7.0V
DC Input Voltage............................................. -0.5V to +7.0V
Output Current into Outputs (LOW) ............................. 16 mA
DC Programming Voltage .............................................12.5V
Latch-Up Current ..................................................... >200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ............................. >2001V
Operating Range
Range
Ambient
Temperature
Commercial
Military^[1]
0°C to +75°C
−55°C to +125°C
Industrial
−40°C to +85°C
Note:
1. T_A is the “instant on” case temperature.
V_CC
5V ±5%
5V ±10%
5V ±10%
]]
Electrical Characteristics Over the Operating Range^[2]
Parameter
Description
Test Conditions
Min. Max. Unit
V_OH
V_OL
V_IH
V_IL[2]
I_IX
I_OZ
I_SC
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
V_CC = Min.,
I_OH = -3.2 mA
Com’l
2.4
V_IN = V_IH or V_IL
I_OH = -2 mA
Mil/Ind
V_CC = Min.,
V_IN = V_IH or V_IL
I_OL = 16 mA
I_OL = 12 mA
Com’l
Mil/Ind
Guaranteed Input Logical HIGH Voltage for All Inputs^[3]
2.0
Guaranteed Input Logical LOW Voltage for All Inputs^[3]
-0.5
Input Leakage Current
V_SS < V_IN < V_CC, V_CC = Max.
-10
Output Leakage Current
V_CC = Max., V_SS < V_OUT < V_CC
-40
Output Short Circuit Current V_CC = Max., V_OUT = 0.5V^[5,6]
-30
V
0.5 V
V
0.8 V
10 µA
40 µA
-90 mA
3