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HCPL-316J-500E Datasheet, PDF (17/33 Pages) AVAGO TECHNOLOGIES LIMITED – 2.5 Amp Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and Fault Status Feedback
VIN+
VIN-
VCC1
GND1
RESET
FAULT
VLED1+
VLED1-
VE
VLED2+
DESAT
VCC2
VC
VOUT
VEE
VEE
7V
0.1
μF
IDSCHG
0.1 μF
30 V
0.1 μF
+
–
30 V
Figure 42. IDSCHG test circuit.
0.1
5 V + μF
–
VIN+
VIN-
VCC1
GND1
RESET
FAULT
VLED1+
VLED1-
VE
VLED2+
DESAT
VCC2
VC
VOUT
VEE
VEE
VOUT
SWEEP
+
–
0.1 μF
Figure 43. UVLO threshold test circuit.
10 mA
VIN+
VIN-
VCC1
GND1
RESET
FAULT
0.1 VLED1+
μF
VLED1-
VE
VLED2+
0.1
DESAT SWEEP μF
VCC2
VC
VOUT
VEE
VEE
0.1 μF
15 V
0.1 μF
+
–
15 V
VIN
0.1
μF
5V
3k
VIN+
VIN-
VCC1
GND1
RESET
FAULT
VLED1+
VLED1-
VE
VLED2+
DESAT
VCC2
VC
VOUT
VEE
VEE
0.1 μF
VOUT
0.1
μF
10 Ω
10
nF
30 V
0.1 μF
+
–
30 V
Figure 44. DESAT threshold test circuit.
Figure 45. tPLH, tPHL, tr, tf test circuit.
0.1
μF
+
–
5V
3k
VIN+
VIN-
VCC1
GND1
RESET
FAULT
VLED1+
VLED1-
Figure 46. tDESAT(10%) test circuit.
VE
VLED2+
DESAT
VCC2
VC
VOUT
VEE
VEE
0.1
VIN μF
30 V
0.1
μF
+
–
5V
VOUT
10 Ω
10
nF
0.1
0.1
μF
μF
+
–
30 V
3k
VFAULT
VIN+
VIN-
VCC1
GND1
RESET
FAULT
VLED1+
VLED1-
Figure 47. tDESAT(FAULT) test circuit.
VE
VLED2+
DESAT
VCC2
VC
VOUT
VEE
VEE
0.1
μF
VIN
0.1
μF
10 Ω
10
nF
30 V
0.1
μF
+
–
30 V
17