T5557 Datasheet, PDF (24/30 Pages) ATMEL Corporation – Multifunctional 330-bit Read/Write RF-Identification IC

Figure 29. Wafer Map
Failed Die Identification
Every die on the wafer not passing Atmel test sequence is marked with inch.
The inch dot specification:
• dot size: 200 µm
• position: center of die
• color: black
24 T5557
4517E–RFID–02/03