T5557 Datasheet, PDF (20/30 Pages) ATMEL Corporation – Multifunctional 330-bit Read/Write RF-Identification IC

Electrical Characteristics
T_amb = +25°C; f_coil = 125 kHz; unless otherwise specified
No. Parameters
Test Conditions
Symbol
Min.
Typ.
Max.
Unit Type*
7 Programming time
8 Endurance
9.1
9.2 Data retention
9.3
10 Resonance capacitor
11.1
Microdule capacitor
11.2 parameters
From last command gap
to re-enter read mode
(64 + 648 internal clocks)
Erase all / Write all ⁽⁴⁾
Top = 55 °C ⁽⁴⁾
Top = 150 °C ⁽⁴⁾
Top = 250 °C ⁽⁴⁾
Mask option⁽⁵⁾
Capacitance tolerance
T_amb
Temperature coefficient
T_prog
n_cycle
t_retention
t_retention
t_retention
C_r
C_r
TBD
5
5.7
100000
10
96
24
70
313.5
TBD
20
78
330
TBD
6
ms
T
50
86
346.5
TBD
Cycles
Years
hrs
hrs
pF
pF
TBD
Q
T
Q
T
T
TBD
11.3
TBD
TBD
TBD
TBD
TBD TBD
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
1. I_DD measurement setup R = 100 k; V_CLK = V_coil = 5 V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation
defeat. I_DD = (V_OUTmax - V_CLK)/R
2. Current into Coil 1/Coil 2 is limited to 10 mA. The damping circuitry has the same structure as the e5550. The damping
characteristics are defined by the internally limited supply voltage (= minimum AC coil voltage)
3. V_mod measurement setup: R = 2.3 k; V_CLK = 3 V; setup with modulation enabled (see Figure 25).
4. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested dice
on uncutted wafer) delivery.
5. The tolerance of the on-chip resonance capacitor C_r is ±10% at 3s over whole production. The capacitor tolerance is
±3% at 3s on a wafer basis.
6. The tolerance of the microcodule resonance capacitor C_r is ±5% at 3s over whole production.
Figure 25. Measurement Setup for I_DD and V_mod
R
-
V_OUTmax
+
V _CLK
BAT68
Coil 1
750
T5557
750
Coil 2
Substrate
BAT68
20 T5557
4517E–RFID–02/03