PALCE26V12 Datasheet, PDF (12/21 Pages) Advanced Micro Devices – 28-Pin EE CMOS Versatile PAL Device

AMD
CAPACITANCE (Note 1)
Parameter
Symbol Parameter Description
Test Conditions
Typ
Unit
CIN
Input Capacitance
VIN = 0 V
VCC = 5.0 V
5
TA = +25°C
pF
COUT
Output Capacitance
VOUT = 0 V
f = 1 MHz
8
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified
where capacitance may be affected.
SWITCHING CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges
(Note 2)
Parameter
Symbol
tPD
Parameter Description
Input or Feedback to Combinatorial Output
-15
Min Max
15
-20
Min Max Unit
20
ns
tS
Setup Time from Input, Feedback, or SP to Clock
10
13
ns
tH
Hold Time
0
0
ns
tCO
Clock to Output
10
12
ns
tAR
Asynchronous Reset to Registered Output
20
25
ns
tARW
Asynchronous Reset Width
15
20
ns
tARR
Asynchronous Reset Recovery Time
15
20
ns
tSPR
Synchronous Preset Recovery Time
10
13
ns
tWL
tWH
fMAX
Clock Width
Maximum
Frequency
(Notes 3 and 4)
LOW
HIGH
External Feedback
Internal Feedback (fCNT)
1/(tS + tCO)
1/(tS + tCF)
8
8
50
58.8
10
ns
10
ns
40
MHz
43
MHz
tEA
Input to Output Enable Using Product Term Control
15
20
ns
tER
Input to Output Disable Using Product Term Control
15
20
ns
Notes:
2. See Switching Test Circuit for test conditions.
3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified
where frequency may be affected.
6. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation:
tCF = 1/fMAX (internal feedback) – tS.
PALCE26V12H-15/20 (Com’l, Ind)
2–317