PALCE26V12 Datasheet, PDF (11/21 Pages) Advanced Micro Devices – 28-Pin EE CMOS Versatile PAL Device

AMD
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . –65°C to +150°C
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . –55°C to +125°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . . . . –0.6 V to +7.0 V
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Stresses above those listed under Absolute Maximum Rat-
ings may cause permanent device failure. Functionality at or
above these limits is not implied. Exposure to Absolute Maxi-
mum Ratings for extended periods may affect device reliabil-
ity. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . +4.75 V to +5.25 V
lndustrial (I) Devices
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . –40°C to +85°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges unless
otherwise specified
Parameter
Symbol
Parameter Description
Test Conditions
Min Max Unit
VOH
Output HIGH Voltage
IOH = –3.2 mA
VIN = VIH or VIL
2.4
V
VCC = Min
VOL
Output LOW Voltage
IOL = 16 mA
VIN = VIH or VIL
VCC = Min
0.4
V
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.0
V
VIL
Input LOW Voltage
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
0.8
V
IIH
Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 2)
10
µA
IIL
Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2)
–10 µA
IOZH
Off-State Output Leakage
VOUT = 5.25 V, VCC = Max
Current HIGH
VIN = VIH or VIL (Note 2)
10
µA
IOZL
Off-State Output Leakage
VOUT = 0 V, VCC = Max
Current LOW
VIN = VIH or VIL (Note 2)
–10 µA
ISC
Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3)
–30 –160 mA
ICC
(Static)
Commerical Supply Current
VIN = 0 V, Outputs Open (IOUT = 0 mA) H-15/20
VCC = Max, f = 0 MHz
105 mA
ICC
(Dynamic)
VIN = 0 V, Outputs Open (IOUT = 0 mA) H-15
VCC = Max, f = 15 MHz
150 mA
ICC
(Static)
Industrial Supply Current
VIN = 0 V, Outputs Open (IOUT = 0 mA) H-20
VCC = Max
130 mA
ICC
(Dynamic)
VIN = 0 V, Outputs Open (IOUT = 0 mA) H-20
VCC = Max, f = 15 MHz
150 mA
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be tested at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V
has been chosen to avoid test problems caused by tester ground degradation.
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PALCE26V12H-15/20 (Com’l, Ind)