EPF10K100ARI240-3 Datasheet, PDF (64/128 Pages) Altera Corporation – Embedded Programmable Logic Device Family

FLEX 10K Embedded Programmable Logic Device Family Data Sheet
Notes to tables:
(1) Microparameters are timing delays contributed by individual architectural elements. These parameters cannot be
measured explicitly.
(2) Operating conditions: V_CCIO = 5.0 V ± 5% for commercial use in FLEX 10K devices.
V_CCIO = 5.0 V ± 10% for industrial use in FLEX 10K devices.
V_CCIO = 3.3 V ± 10% for commercial or industrial use in FLEX 10KA devices.
(3) Operating conditions: V_CCIO = 3.3 V ± 10% for commercial or industrial use in FLEX 10K devices.
V_CCIO = 2.5 V ± 0.2 V for commercial or industrial use in FLEX 10KA devices.
(4) Operating conditions: V_CCIO = 2.5 V, 3.3 V, or 5.0 V.
(5) Because the RAM in the EAB is self-timed, this parameter can be ignored when the WE signal is registered.
(6) EAB macroparameters are internal parameters that can simplify predicting the behavior of an EAB at its boundary;
these parameters are calculated by summing selected microparameters.
(7) These parameters are worst-case values for typical applications. Post-compilation timing simulation and timing
analysis are required to determine actual worst-case performance.
(8) External reference timing parameters are factory-tested, worst-case values specified by Altera. A representative
subset of signal paths is tested to approximate typical device applications.
(9) Contact Altera Applications for test circuit specifications and test conditions.
(10) These timing parameters are sample-tested only.
Figures 29 and 30 show the asynchronous and synchronous timing
waveforms, respectively, for the EAB macroparameters in Table 34.
Figure 29. EAB Asynchronous Timing Waveforms
EAB Asynchronous Read
WE
Address
Data-Out
a0
a1
t_EABAA
d0
d1
a2
t_EABRCCOMB
d2
EAB Asynchronous Write
WE
Data-In
Address ^a0
din0
t_EABWASU
Data-Out
t_EABWP
t_EABWDSU
t_EABWCCOMB
a1
din0
din1
t_EABWDH
t_EABWAH
t_EABDD
din1
a3
d3
a2
dout2
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