ACE25C160G Datasheet, PDF (9/36 Pages) ACE Technology Co., LTD. – Uniform SECTOR Dual and Quad Serial Flash

ACE25C160G
Uniform SECTOR Dual and Quad Serial Flash
CMP bit
The CMP bit is a non-volatile Read/Write bit in the Status Register (S14). It is used in conjunction the
SEC-BP0 bits to provide more flexibility for the array protection. Please see the Status registers
Memory Protection table for details. The default setting is CMP=0.
SUS bit
The SUS bit is a read only bit in the status register (S15 ) that is set to 1 after executing an
Erase/Program Suspend (75H) command. The SUS bit is cleared to 0 by Erase/Program Resume
(7AH) command as well as a power-down, power-up cycle.
Commands Description
All commands, addresses and data are shifted in and out of the device, beginning with the most
significant bit on the first rising edge of SCLK after CS# is driven low. Then, the one-byte command
code must be shifted in to the device, most significant bit first on SI, each bit being latched on the
rising edges of SCLK.
See Table2, every command sequence starts with a one-byte command code. Depending on the
command, this might be followed by address bytes, or by data bytes, or by both or none. CS# must be
driven high after the last bit of the command sequence has been shifted in. For the command of Read,
Fast Read, Read Status Register or Release from Deep Power-Down, and Read Device ID, the
shifted-in command sequence is followed by a data-out sequence. CS# can be driven high after any
bit of the data-out sequence is being shifted out.
For the command of Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register,
Write Enable, Write Disable or Deep Power-Down command, CS# must be driven high exactly at a
byte boundary, otherwise the command is rejected, and is not executed. That is CS# must driven high
when the number of clock pulses after CS# being driven low is an exact multiple of eight. For Page
Program, if at any time the input byte is not a full byte, nothing will happen and WEL will not be reset.
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