ACE25C160G Datasheet, PDF (30/36 Pages) ACE Technology Co., LTD. – Uniform SECTOR Dual and Quad Serial Flash

ACE25C160G
Uniform SECTOR Dual and Quad Serial Flash
Data Retention And Endurance
Parameter
Minimum Pattern Data Retention Time
Erase / Program Endurance
Test Condition
150℃
125℃
-40 to 85 ℃
Min
10
20
100K
Units
Years
Years
Cycles
Latch Up Characteristics
Parameter
Min
Max
Input Voltage Respect To VSS On I/O Pins -1.0V VCC+1.0V
VCC Current
-100mA 100mA
Absolute Maximum Ratings
Parameter
Value
Unit
Ambient Operating Temperature -40 to 85 ℃
Storage Temperature
-55 to 125 ℃
Output Short Circuit Current
200
mA
Applied Input / Output Voltage -0.5 to 4.0 V
VCC
-0.5 to 4.0 V
Capacitance Measurement Conditions
Symbol
Parameter
Min Typ Max Unit
CIN
Input Capacitance
6
pF
COUT
Output Capacitance
8
pF
Load Capacitance
30
pF
Input Rise And Fall time
5
ns
C_L
Input Pause Voltage
0.2VCC⁽¹⁾ to 0.8VCC V
Input Timing Reference Voltage 0.3VCC to 0.7VCC
V
Output Timing Reference Voltage
0.5VCC
V
Figure29. Input Test Waveform And Measurement Level
Conditions
VIN=0V
VOUT=0V
Note:1. Design target is 0.2Vcc. It can be as low as 0.12Vcc during the characterization of the current design. It will be improved
in the future design.
VER 1.5 30