English
Language : 

BQ40Z60_16 Datasheet, PDF (9/47 Pages) Texas Instruments – Programmable Battery Management Unit
www.ti.com
bq40z60
SLUSAW3C – DECEMBER 2014 – REVISED JULY 2015
8.12 Current Wake Comparator
Typical values stated where TA = 25°C and VCC = 10.8 V, Min/Max values stated where TA = –40°C to 85°C and VCC =
2.2 V to 26 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
VWAKE
Wake voltage
threshold
VWAKE(DRIFT)
Temperature drift
of VWAKE accuracy
tWAKE
Time from
application of
current to wake
VWAKE = VSRP – VSRN
VWAKE = VSRP – VSRN
VWAKE = VSRP – VSRN
VWAKE = VSRP – VSRN
±0.3
±0.625
±0.6
±1.25
±1.2
±2.5
±2.4
±5.0
0.5%
0.25
±0.9
±1.8
mV
±3.6
±7.2
°C
0.5 ms
tWAKE(SU)
Wake comparator
startup time
500
1000 µs
8.13 Coulomb Counter(1)
Typical values stated where TA = 25°C and VCC = 10.8 V, Min/Max values stated where TA = –40°C to 85°C and VCC =
2.2 V to 26 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Input voltage range
–0.1
0.1 V
Full scale range
Integral nonlinearity(2)
16-bit, Best fit over input voltage range
–VREF1/10
±5.2
VREF1/10
±22.3
V
LSB
Offset error
16-bit, Post-calibration
±5
±10 µV
Offset error drift
Gain error
15-bit + sign, Post-calibration
15-bit + sign, Over input voltage range
0.2
±0.2%
0.3 µV/°C
±0.8% FSR(3)
Gain error drift
15-bit + sign, Over input voltage range
150 PPM/°C
Effective input resistance
2.5
MΩ
(1) Coulomb counter electrical specifications are assured when battery charging function is disabled.
(2) 1 LSB = VREF1/(10 × 2N) = 1.215/(10 × 215) = 3.71 µV
(3) Full-scale reference
8.14 CC Digital Filter
Typical values stated where TA = 25°C and VCC = 10.8 V, Min/Max values stated where TA = –40°C to 85°C and VCC =
2.2 V to 26 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Conversion time
Single conversion
250
ms
Effective resolution
Single conversion
15
Bits
8.15 ADC(1)
Over-operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Input voltage range
Full scale range
Integral nonlinearity(2)
Offset error(3)
Internal reference (VREF1)
External reference (VREG)
VFS = VREF1 or VREG
16-bit, Best fit, –0.1 V to 0.8 × VREF1
16-bit, Best fit, –0.2 V to –0.1 V
16-bit, Post-calibration, VFS = VREF1
MIN
–0.2
–0.2
–VFS
TYP
±67
MAX
1
0.8 × VREG
VFS
±6.6
±13.1
±157
UNIT
V
V
LSB
µV
(1) ADC electrical specifications are assured when battery charging function is disabled.
(2) 1 LSB = VREF1/(2N) = 1.225/(215) = 37.4 µV (when ADCTL[SPEED1, SPEED0] = 0, 0)
(3) For VC1–VSS, VC2–VC1, VC3–VC2, VC3–VSS, ACP–VSS, and VREF1/2, the offset error is multiplied by (1/ADC multiplexer scaling
factor (K)).
Copyright © 2014–2015, Texas Instruments Incorporated
Submit Documentation Feedback
9
Product Folder Links: bq40z60