DRV401-Q1 Datasheet, PDF (8/39 Pages) Texas Instruments – DRV401-Q1 Sensor Signal Conditioning Device for Closed-Loop Magnetic Current Sensor

DRV401-Q1
SBOS814 – DECEMBER 2016
6.6 Typical Characteristics
at T_A = 25°C and V_DD1 = V_DD2 = 5 V with external 100-kHz filter bandwidth, (unless otherwise noted)
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0.04
0.03
0.02
0.01
MM44664455--X211
0
-0.01
M4645-X080
-0.02
-0.03
-0.04
4.1 4.3 4.5 4.7 4.9 5.1 5.3 5.5 5.7 5.9 6.1
V_DD (V)
100
60-Hz Line Frequency and Multiples
(measured in a 60-Hz environment)
Divided Field
Probe Frequency
10
0.1
0.1
1
10
100
1k
10k 100k
Frequency (Hz)
Sensor M4645−X080, R_SHUNT = 10 Ω, Mode = Low
Figure 1. DRV401-Q1 Device and Sensor: Offset vs Supply
Voltage
0.3
T = -50°C
0.2
T = 25°C
T = 85°C
T = 125°C
0.1
0
-0.1
-0.2
T_C (R_SHUNT) ±25 ppm/°C
-0.3
-300 -200 -100
0
100
200
300
Primary Current (A)
Figure 3. DRV401-Q1 Device and Sensor: Absolute Error
Over-Range
Over-Range
V_OUT
V_OUT
ERROR
ERROR
I_PRIM
NOTE: I_PRIM = 3000 A corresponds to I_COMP = 3 A
I_PRIM
0 20 40 60 80 100 120 140 160 180 200
Time (ms)
Measurements by Vacuumschmelze GmbH.
Figure 2. DRV401-Q1 Device and Sensor: Output Voltage
Noise Density
1.20
DRV401-Q1 with M4645-X600 Sensor
1.15
DRV401-Q1 with M4645-X211 Sensor
1.10
DRV401-Q1 with M4645-X080 Sensor
1.05
1.00
0.95
0.90
0.85
0.80
10
100
1k
10 k
100 k
1M
Frequency (Hz)
Soldered DWP−20 with 1-in² copper pad. Measurements by
Vacuumschmelze GmbH.
Figure 4. Gain Flatness vs Frequency
RTO
Voltage Offset (mV)
Measurements by Vacuumschmelze GmbH.
Figure 5. 3-A I_COMP Overload Recovery
Figure 6. Differential Amplifier: Voltage Offset Production
Distribution
8
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