OPA2333-HT Datasheet, PDF (5/23 Pages) Texas Instruments – 1.8-V MICROPOWER CMOS OPERATIONAL AMPLIFIER ZERO-DRIFT SERIES

OPA2333-HT
www.ti.com
SBOS483F – JULY 2009 – REVISED AUGUST 2012
Electrical Characteristics: V_S = 1.8 V to 5.5 V
Boldface limits apply over the specified temperature range, T_A = –55°C to 210°C. At T_A = 25°C, R_L = 10 kΩ connected to
V_S/2, V_CM = V_S/2, and V_OUT = V_S/2 (unless otherwise noted).
PARAMETER
TEST CONDITIONS
T_A = –55°C to 125°C
MIN
TYP MAX
T_A = 175°C⁽¹⁾
MIN TYP MAX
T_A = 210°C ⁽²⁾
MIN TYP MAX
UNIT
OFFSET
VOLTAGE
Input offset
voltage
V_OS
V_S = 5 V
2 10
μV
over
temperature
22
26
26 μV
vs
temperature
dV_OS/d_T
0.02
0.05
0.05
μV/°C
vs power
supply
PSRR
V_S = 1.8 V to 5.5 V
1
6
1.2
8
1.7 11 μV/V
Long-term
stability ⁽³⁾
See ⁽³⁾
Channel
separation, dc
0.1
μV/V
INPUT BIAS
CURRENT
Input bias current
I_B
over
Temperature
±70 ±200
±150
±1250
pA
±5300
pA
Input offset
current
I_OS
±140 ±400
±700
±1060
0
pA
NOISE
Input voltage
noise,
f = 0.01 Hz to
1 Hz
0.3
1.0
1.0
μV_PP
Input voltage
noise,
f = 0.1 Hz to
10 Hz
1.1
1.5
1.5
μV_PP
Input current
noise, f = 10 Hz
i_n
100
fA/√Hz
INPUT
VOLTAGE
RANGE
Common mode
voltage range
V_CM
(V–) –
0.1
(V+) (V–) –
+ 0.1 0.25
(V–) + (V–) –
0.25 0.25
(V–) +
0.25
V
Common-Mode
Rejection Ratio
CMRR (V–) – 0.1 V < V_CM < (V+) + 0.1 V
102
130
101
91
dB
INPUT
CAPACITANCE
Differential
2
4.25
4.25
pF
Common mode
4
12.25
12.25
pF
OPEN-LOOP
GAIN
Open-loop
voltage gain
FREQUENCY
RESPONSE
A_OL
(V–) + 100 mV < V_O < (V+) – 100 mV,
R_L = 10 kΩ
104
130
93 110
85 93
dB
Gain-bandwidth
product
GBW
C_L = 100 pF
350
350
350
kHz
Slew rate
SR
G=1
0.16
0.25
0.25
V/μs
(1) Minimum and maximum parameters are characterized for operation at T_A = 175°C, but may not be production tested at that
temperature. Production test limits with statistical guardbands are used to ensure high temperature performance.
(2) Minimum and maximum parameters are characterized for operation at T_A = 210°C, but may not be production tested at that
temperature. Production test limits with statistical guardbands are used to ensure high temperature performance.
(3) 300-hour life test at 150°C demonstrated randomly distributed variation of approximately 1 μV.
Copyright © 2009–2012, Texas Instruments Incorporated
Product Folder Links: OPA2333-HT
Submit Documentation Feedback
5