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LME49830 Datasheet, PDF (5/23 Pages) National Semiconductor (TI) – Mono High Fidelity 200 Volt MOSFET Power Amplifier Input Stage with Mute
LME49830
www.ti.com
SNAS396D – JANUARY 2008 – REVISED APRIL 2013
ELECTRICAL CHARACTERISTICS VCC = +100V, VEE = –100V(1)(2)
The following specifications apply for IMUTE = 150μA unless otherwise specified. Limits apply for TA = 25°C.
Symbol
Parameter
Conditions
LME49830
Typical(3) Limit(4)
ICC
Total Positive Quiescent Power
Supply Current
VIN = 0V, VO = 0V, IO = 0A
19
24
IEE
Total Negative Quiescent Power
Supply Current
VIN = 0V, VO = 0V, IO = 0A
–21
THD+N
VBIAS
AV(CL)
AV(OL)
VOM
VNOISE
Total Harmonic Distortion +
Noise
Bias Voltage
Closed Loop Voltage Gain
Open Loop Gain
Output Voltage Swing
Output Noise
No load, f = 1kHz, AV = 30dB
VOUT = 30VRMS, 30kHz BW
f = DC
VIN = 1mVRMS, f = 1kHz, CC = 10pF
THD = 0.05%, f = 20Hz to 20kHz
RS = 10kΩ, AV = 30dB,
30kHz BW
A-weighted
0.0006
16
15
26
112
82
88
68
44
28
205
IOUT
IMUTE
SR
VOS
IB
PSRRAC
PSRRDC
Maximum Output Current
Current from Output pins
56
Current into Mute Pin
To put part in “play” mode
Slew Rate
Input Offset Voltage
Input Bias Current
Power Supply Rejection Ratio
(AC)
Power Supply Rejection Ratio
(DC)
VIN = 1.2VP-P, AV = 30dB,
f = 10kHz square wave, CLOAD = 2,000pF
VCM = 0V, IO = 0mA, IMUTE = 150μA
VCM = 0V, IO = 0mA, IMUTE = 0μA
VCM = 0V, IO = 0mA
RS = 1kΩ, f = 100Hz,VRIPPLE = 1VRMS,
Input Referred, AV = 30dB
RS = 1kΩ, Input Referred, AV = 30dB
39
±0.9
±0.4
95
104
105
47
130
±3
±4.2
250
94
IAB
Bias Control Current
Shorted output, shorted bias control
2
1.6
2.7
Units
(Limits)
mA (max)
mA
%
V (min)
dB (min)
dB (min)
VRMS
μV
μV (max)
mA (min)
μA (min)
V/μs
mV (max)
mV (max)
nA (max)
dB
dB (min)
mA (min)
mA (max)
(1) The Electrical Characteristics tables list ensure specifications under the listed Recommended Operating Conditions except as otherwise
modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are not
ensured.
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. All
voltages are measured with respect to the ground pin, unless otherwise specified.
(3) Typical values represent most likely parametric norms at TA = +25°C, and at the Recommended Operation Conditions at the time of
product characterization.
(4) Data sheet min and max specification limits are specified by test or statistical analysis.
Copyright © 2008–2013, Texas Instruments Incorporated
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