BQ24725A_17 Datasheet, PDF (5/47 Pages) Texas Instruments – 1-4 Cell Li+ Battery SMBus Charge Controller with N-Channel Power MOSFET Selector and Advanced Circuit Protection

www.ti.com
bq24725A
SLUSAL0A – SEPTEMBER 2011 – REVISED AUGUST 2014
6.2 Handling Ratings
T_stg
V_(ESD)
Storage temperature range
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all
pins ⁽¹⁾
Charged device model (CDM), per JEDEC specification
JESD22-C101, all pins⁽²⁾
MIN
–55
–2000
–500
MAX
155
2000
500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
°C
V
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
Voltage range
Maximum difference voltage
Junction temperature range, T_J
SRN, SRP, ACN, ACP, CMSRC, VCC
PHASE
ACDET, SDA, SCL, LODRV, REGN, IOUT, ILIM, ACOK
BTST, HIDRV, ACDRV, BATDRV
SRP–SRN, ACP–ACN
MIN NOM MAX UNIT
0
24
-2
24
V
0
6.5
0
30
–0.2
0.2 V
0
125 °C
6.4 Thermal Information
THERMAL METRIC⁽¹⁾
bq24725A
RGR (20 PIN)
UNIT
R_θJA
R_θJCtop
R_θJB
ψ_JT
ψ_JB
R_θJCbot
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistanc
46.8
56.9
46.6
°C/W
0.6
15.3
4.4
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
Copyright © 2011–2014, Texas Instruments Incorporated
Product Folder Links: bq24725A
Submit Documentation Feedback
5