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LM4F111C4QR Datasheet, PDF (200/1113 Pages) Texas Instruments – Microcontroller
JTAG Interface
4.5.2
4.5.2.1
allowing components that are not needed for a specific test to be bypassed in the JTAG scan chain
by loading them with the BYPASS instruction. See “BYPASS Data Register” on page 200 for more
information.
Data Registers
The JTAG module contains six Data Registers. These serial Data Register chains include: IDCODE,
BYPASS, Boundary Scan, APACC, DPACC, and ABORT and are discussed in the following sections.
IDCODE Data Register
The format for the 32-bit IDCODE Data Register defined by the IEEE Standard 1149.1 is shown in
Figure 4-3. The standard requires that every JTAG-compliant microcontroller implement either the
IDCODE instruction or the BYPASS instruction as the default instruction. The LSB of the IDCODE
Data Register is defined to be a 1 to distinguish it from the BYPASS instruction, which has an LSB
of 0. This definition allows auto-configuration test tools to determine which instruction is the default
instruction.
The major uses of the JTAG port are for manufacturer testing of component assembly and program
development and debug. To facilitate the use of auto-configuration debug tools, the IDCODE
instruction outputs a value of 0x4BA0.0477. This value allows the debuggers to automatically
configure themselves to work correctly with the Cortex-M4F during debug.
Figure 4-3. IDCODE Register Format
31
28 27
TDI
Version
Part Number
12 11
Manufacturer ID
10
1 TDO
4.5.2.2
BYPASS Data Register
The format for the 1-bit BYPASS Data Register defined by the IEEE Standard 1149.1 is shown in
Figure 4-4. The standard requires that every JTAG-compliant microcontroller implement either the
BYPASS instruction or the IDCODE instruction as the default instruction. The LSB of the BYPASS
Data Register is defined to be a 0 to distinguish it from the IDCODE instruction, which has an LSB
of 1. This definition allows auto-configuration test tools to determine which instruction is the default
instruction.
Figure 4-4. BYPASS Register Format
0
TDI 0 TDO
4.5.2.3
Boundary Scan Data Register
The format of the Boundary Scan Data Register is shown in Figure 4-5. Each GPIO pin, starting
with a GPIO pin next to the JTAG port pins, is included in the Boundary Scan Data Register. Each
GPIO pin has three associated digital signals that are included in the chain. These signals are input,
output, and output enable, and are arranged in that order as shown in the figure.
When the Boundary Scan Data Register is accessed with the SAMPLE/PRELOAD instruction, the
input, output, and output enable from each digital pad are sampled and then shifted out of the chain
200
April 25, 2012
Texas Instruments-Advance Information