TLC320AD57 Datasheet, PDF (16/21 Pages) Texas Instruments – Sigma-Delta Stereo Analog-to-Digital Converter

3.3 Electrical Characteristics
3.3.1 Digital Interface, T_A = 25°C, AV_DD = DV_DD = 5 V
PARAMETER
TEST CONDITIONS
VIH
VIL
VOH
VOL
IIH
IIL
Ci
Co
High-level input voltage
Low-level input voltage
High-level output voltage, DOUT
Low-level output voltage, DOUT
High-level input current, any digital input
Low-level input current, any digital input
Input capacitance
Output capacitance
IOH = 2 mA
IOL = 2 mA
MIN TYP MAX UNIT
2 4.6
V
0.2 0.8 V
2.4 4.6
V
0.2 0.4 V
1
µA
1
µA
5
pF
5
pF
3.3.2 Analog Interface
3.3.2.1 ADC Modulator, T_A = 25°C, AV_DD = DV_DD = 5 V, f_s = 48 kHz, Bandwidth = 24 kHz,
HPByp = 1, CMODE = 0, MODE0 – 2 = 101
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
Resolution
18
Bits
DYNAMIC PERFORMANCE
Signal to noise (EIAJ)
INLP = INRP = 2.5 V dc
93
97
dB
INLM = INRM = 2.5 V dc
Dynamic range
–1dB down from
91
95
dB
Signal to noise + distortion (THD + N)
6-V differential input between
91
dB
Total harmonic distortion (THD)
INRP (INLP) and INRM (INLM)
0.001%
Interchannel isolation
108
dB
DC ACCURACY
Gain error
Interchannel gain mismatch
Offset error (18-bit resolution)
Offset drift
± 0.2
± 0.2
±5
± 0.17
dB
dB
mV
LSB/°C
3–2