TLC3574IDW Datasheet, PDF (8/49 Pages) Texas Instruments – 5-V ANALOG,3-/5-V DIGITAL, 14-/12-BIT, 200-KSPS, 4-/8-CHANNEL SERIAL ANALOG-TO-DIGITAL CONVERTERS WITH 10-V INPUTS

TLC3574, TLC3578, TLC2574, TLC2578
5ĆV ANALOG, 3Ć/5ĆV DIGITAL, 14Ć/12ĆBIT, 200ĆKSPS, 4Ć/8ĆCHANNEL
SERIAL ANALOGĆTOĆDIGITAL CONVERTERS WITH ±10ĆV INPUTS
SLAS262C − OCTOBER 2000 − REVISED MAY 2003
TLC3574/78 DW and PW package device AC/DC performance (continued)
PARAMETER
TEST CONDITIONS
MIN TYP† MAX UNIT
AC Accuracy—Normal Short Sampling
SINAD Signal-to-noise ratio + distortion
THD
Total harmonic distortion
SNR
Signal-to-noise ratio
ENOB Effective number of bits
SFDR Spurious free dynamic range
Channel-to-channel isolation
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
Fixed channel in conversion mode 00, fi= 35 kHz,
See Notes 2 and 5
79
dB
75
−82
dB
−78
80
dB
78
12.8
Bits
12.2
84
dB
79
81
dB
Analog input bandwidth
Full power bandwidth, −3 dB
Full power bandwidth, −1 dB
1
MHz
700
kHz
† _{All typical values are at TA = 25°C.}
NOTES: 2. This is for a fixed channel in conversion mode 00 or 01. When switching the channels, additional multiplexer setting time is required
to overcome the memory effect of the charge redistribution DAC.
5. It is measured by applying a full-scale of 35 kHz signal to other channels and determining how much the signal is attenuated in the
channel of interest. The converter samples this examined channel continuously. The channel-to-channel isolation is degraded if the
converter samples different channels alternately.
8
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