TLC3574IDW Datasheet, PDF (11/49 Pages) Texas Instruments – 5-V ANALOG,3-/5-V DIGITAL, 14-/12-BIT, 200-KSPS, 4-/8-CHANNEL SERIAL ANALOG-TO-DIGITAL CONVERTERS WITH 10-V INPUTS

TLC3574, TLC3578, TLC2574, TLC2578
5ĆV ANALOG, 3Ć/5ĆV DIGITAL, 14Ć/12ĆBIT, 200ĆKSPS, 4Ć/8ĆCHANNEL
SERIAL ANALOGĆTOĆDIGITAL CONVERTERS WITH ±10ĆV INPUTS
SLAS262C − OCTOBER 2000 − REVISED MAY 2003
TLC2574/78 DW and PW package devices AC/DC performance
PARAMETER
TEST CONDITIONS
MIN TYP† MAX UNIT
DC Accuracy
EL
Integral linearity error
ED
Differential linearity error
EO
Bipolar zero error
EFS(+) Positive full scale error
EFS(−) Negative full scale error
AC Accuracy
See Note 6
See Note 7
See Note 7
See Note 7
−1 ±0.5
1 LSB
−1 ±0.5
1 LSB
−0.30 ±0.08 0.36 %FS
−0.55 ±0.04 0.61 %FS
−0.30 ±0.13 0.79 %FS
SINAD Signal-to-noise ratio + distortion
THD
Total harmonic distortion
SNR
Signal-to-noise ratio
ENOB Effective number of bits
SFDR Spurious free dynamic range
Analog input bandwidth
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
fi= 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
fi = 20 kHz
fi = 100 kHz
Full power bandwidth, −3 dB
Full power bandwidth, −1 dB
70
72
dB
70
−82 −76
dB
−80
71
72
dB
71
11.3 11.7
Bits
11.3
78
83
dB
80
1
MHz
700
kHz
Channel-to-channel Isolation
Fixed channel in conversion mode 00, fi = 35 kHz,
See Note 8
81
dB
† _{All typical values are at TA = 25°C.}
NOTES: 6. Linear error is the maximum deviation from the best fit straight line through the A/D transfer characteristics.
7. Bipolar zero error is the difference between 100000000000 and the converted output for zero input voltage; positive full-scale error
is the difference between 111111111111 and the converted output for positive full-scale input voltage (10 V); negative full-scale error
is the difference between 000000000000 and the converted output for negative full-scale input voltage (−10 V).
8. It is measured by applying a full-scale of 35 kHz signal to other channels and determining how much the signal is attenuated in the
channel of interest. The converter samples this examined channel continuously. The channel-to-channel isolation is degraded if the
converter samples different channels alternately.
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