LPV521_15 Datasheet, PDF (8/33 Pages) Texas Instruments – LPV521 NanoPower, 1.8-V, RRIO, CMOS Input, Operational Amplifier

LPV521
SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014
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5-V DC Electrical Characteristics (continued)
Unless otherwise specified, all limits for T_A = 25°C, V⁺ = 5 V, V^− = 0 V, V_CM = V_O = V⁺/2, and R_L > 1 MΩ.⁽¹⁾
PARAMETER
TEST CONDITIONS
MIN
TYP
V_O
Output Swing High
R_L = 100 kΩ to V⁺/2
3
V_IN(diff) = 100 mV
Temperature extremes
Output Swing Low
R_L = 100 kΩ to V⁺/2
3
V_IN (diff) = −100 mV
Temperature extremes
I_O
Output Current
Sourcing, V_O to V^−
V_IN(diff) = 100 mV
Temperature extremes
Sinking, V_O to V⁺
V_IN(diff) = −100 mV
Temperature extremes
15
23
8
15
22
8
I_S
Supply Current
V_CM = 0.3 V
351
Temperature extremes
V_CM = 4.7 V
475
Temperature extremes
MAX
50
50
50
50
400
620
600
870
UNIT
mV from
either rail
mA
nA
6.10 5-V AC Electrical Characteristics⁽¹⁾
Unless otherwise specified, all limits for T_A = 25°C, V⁺ = 5 V, V^− = 0 V, V_CM = V_O = V⁺/2, and R_L > 1 MΩ.
PARAMETER
TEST CONDITIONS
MIN
(2)
TYP
(3)
MAX
(2)
UNIT
GBW
SR
θ_m
G_m
e_n
I_n
EMIRR
Gain-Bandwidth Product
Slew Rate
Phase Margin
Gain Margin
Input-Referred Voltage Noise Density
Input-Referred Voltage Noise
Input-Referred Current Noise
EMI Rejection Ratio, IN+ and IN−⁽⁴⁾
C_L = 20 pF, R_L = 100 kΩ
A_V = +1,
V_IN = 0 V to 5 V
Falling Edge
Temperature
extremes
Rising Edge
Temperature
extremes
C_L = 20 pF, R_L = 100 kΩ
C_L = 20 pF, R_L = 100 kΩ
f = 100 Hz
0.1 Hz to 10 Hz
f = 100 Hz
V_{RF_PEAK} = 100 mV_P (−20 dB_P),
f = 400 MHz
V_{RF_PEAK} = 100 mV_P (−20 dB_P),
f = 900 MHz
V_{RF_PEAK} = 100 mV_P (−20 dB_P),
f = 1800 MHz
V_{RF_PEAK} = 100 mV_P (−20 dB_P),
f = 2400 MHz
6.2
1.1
2.7
1.2
1.1
2.4
1.2
73
20
255
22
100
121
121
124
142
kHz
V/ms
deg
dB
nV/√Hz
μV_PP
fA/√Hz
dB
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables
under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are guaranteed by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production
material.
(4) The EMI Rejection Ratio is defined as EMIRR = 20log (VRF_PEAK/ΔVOS).
8
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