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TMS320VC5401 Datasheet, PDF (52/81 Pages) Texas Instruments – Fixed-Point Digital Signal Processor
Electrical Specifications
5.8 Memory and Parallel I/O Interface Timing
5.8.1 Memory Read
External memory reads can be performed in consecutive or nonconsecutive mode under control of the
CONSEC bit in the BSCR.
Table 5−7 and Table 5−8 assume testing over recommended operating conditions with MSTRB = 0 and
H = 0.5tc(CO) (see Figure 5−5).
Table 5−7. Memory Read Timing Requirements
ta(A)M
Access time, read data access from address valid†
ta(MSTRBL)
Access time, read data access from MSTRB low
tsu(D)R
Setup time, read data before CLKOUT low
th(D)R
th(A-D)R
Hold time, read data after CLKOUT low
Hold time, read data after address invalid
th(D)MSTRBH Hold time, read data after MSTRB high
† Address, PS, and DS timings are all included in timings referenced as address.
MIN MAX UNIT
2H−9 ns
2H−10 ns
8
ns
0
ns
2
ns
2
ns
Table 5−8. Memory Read Switching Characteristics
PARAMETER
td(CLKL-A)
td(CLKH-A)
Delay time, CLKOUT low to address valid†‡
Delay time, CLKOUT high (transition) to address valid†§
td(CLKL-MSL)
Delay time, CLKOUT low to MSTRB low
td(CLKL-MSH)
Delay time, CLKOUT low to MSTRB high
th(CLKL-A)R
Hold time, address valid after CLKOUT low†‡
th(CLKH-A)R
Hold time, address valid after CLKOUT high†§
† Address, PS, and DS timings are all included in timings referenced as address.
‡ In the case of a memory read preceded by a memory read
§ In the case of a memory read preceded by a memory write
MIN MAX UNIT
−4
5 ns
−4
5 ns
−3
5 ns
−3
5 ns
−4
5 ns
−4
5 ns
52 SPRS153C
December 2000 − Revised February 2004