MSP430X47X3_07 Datasheet, PDF (51/76 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430x47x3, MSP430x47x4
MIXED SIGNAL MICROCONTROLLER
SLAS545A − MAY 2007 − REVISED DECEMBER 2007
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
Flash Memory
PARAMETER
TEST CONDITIONS VCC
MIN TYP MAX UNIT
V_CC(PGM/
ERASE)
Program and Erase supply voltage
2.2
3.6 V
f_FTG
Flash Timing Generator frequency
257
476 kHz
I_PGM
I_ERASE
Supply current from V_CC during program
Supply current from V_CC during erase
2.2 V/3.6 V
2.2 V/3.6 V
3
5 mA
3
7 mA
t_CPT
Cumulative program time (see Note 1)
2.2 V/3.6 V
10 ms
t_CMErase
Cumulative mass erase time
Program/Erase endurance
2.2 V/3.6 V
20
10⁴
10⁵
ms
cycles
t_Retention
Data retention duration
T_J = 25°C
100
years
t_Word
t_{Block, 0}
t_{Block, 1-63}
t_{Block, End}
Word or byte program time
Block program time for 1^st byte or word
Block program time for each additional byte or word
Block program end-sequence wait time
see Note 2
30
25
18
6
t_FTG
t_{Mass Erase}
Mass erase time
10593
t_{Seg Erase}
Segment erase time
4819
NOTES: 1. The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
2. These values are hardwired into the Flash Controller’s state machine (t_FTG = 1/f_FTG).
RAM
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
V_(RAMh)
RAM retention supply voltage (see Note 1)
CPU halted
1.6
V
NOTE 1: This parameter defines the minimum supply voltage V_CC when the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
JTAG Interface
PARAMETER
TEST
CONDITIONS
V_CC
f_TCK
TCK input frequency
see Note 1
2.2 V
3V
R_Internal
Internal pull-up resistance on TMS, TCK, TDI/TCLK see Note 2
2.2 V/ 3 V
NOTES: 1. f_TCK may be restricted to meet the timing requirements of the module selected.
2. TMS, TDI/TCLK, and TCK pull-up resistors are implemented in all versions.
MIN NOM MAX UNIT
0
5 MHz
0
10 MHz
20
35
50 kΩ
JTAG Fuse (see Note 1)
PARAMETER
TEST
CONDITIONS
V_CC
MIN NOM MAX UNIT
V_CC(FB)
Supply voltage during fuse-blow condition
T_A = 25°C
2.5
V
V_FB
Voltage level on TDI/TCLK for fuse-blow: F versions
6
7V
I_FB
Supply current into TDI/TCLK during fuse blow
100 mA
t_FB
Time to blow fuse
1 ms
NOTES: 1. Once the fuse is blown, no further access to the MSP430 JTAG/Test and emulation features is possible. The JTAG block is switched
to bypass mode.
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