LP2996LQ Datasheet, PDF (3/26 Pages) Texas Instruments – LP2996-N DDR Termination Regulator

LP2996-N
www.ti.com
SNOSA40J – NOVEMBER 2002 – REVISED MARCH 2013
Operating Range
Junction Temp. Range⁽¹⁾
AVIN to GND
PVIN Supply Voltage
SD Input Voltage
0°C to +125°C
2.2V to 5.5V
0 to AVIN
0 to AVIN
(1) At elevated temperatures, devices must be derated based on thermal resistance. The device in the SOIC-8 package must be derated at
θ_JA = 151.2° C/W junction to ambient with no heat sink.
Electrical Characteristics
Specifications with standard typeface are for T_J = 25°C and limits in boldface type apply over the full Operating
Temperature Range (T_J = 0°C to +125°C)⁽¹⁾. Unless otherwise specified, AVIN = PVIN = 2.5V, VDDQ = 2.5V⁽²⁾.
Symbol
Parameter
Conditions
Min
Typ
Max
V_REF
V_REF Voltage
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
1.135
1.235
1.335
1.158
1.258
1.358
1.185
1.285
1.385
Z_VREF
V_TT
V_REF Output Impedance
V_TT Output Voltage
I_REF = -30 to +30 μA
I_OUT = 0A
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
I_OUT = ±1.5A⁽³⁾
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
1.125
1.225
1.325
1.125
1.225
1.325
2.5
1.159
1.259
1.359
1.159
1.259
1.359
1.190
1.290
1.390
1.190
1.290
1.390
Vos_TT/V_TT
I_Q
Z_VDDQ
I_SD
V_TT Output Voltage Offset
(V_REF-V_TT)
Quiescent Current⁽⁴⁾
VDDQ Input Impedance
Quiescent Current in
Shutdown ⁽⁴⁾
I_OUT = 0A
I_OUT = -1.5A⁽³⁾
I_OUT = +1.5A⁽³⁾
I_OUT = 0A⁽¹⁾
SD = 0V
-20
0
20
-25
0
25
-25
0
25
320
500
100
115
150
I_{Q_SD}
V_IH
Shutdown Leakage Current
Minimum Shutdown High
Level
SD = 0V
2
5
1.9
V_IL
Maximum Shutdown Low
0.8
Level
I_V
I_SENSE
T_SD
T_SD_HYS
V_TT Leakage Current in
Shutdown
V_SENSE Input Current
Thermal Shutdown
SD = 0V
V_TT = 1.25V
See ⁽⁵⁾
Thermal Shutdown Hysteresis
1
10
13
165
10
Units
V
kΩ
V
mV
µA
kΩ
µA
µA
V
V
µA
nA
Celcius
Celcius
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL).
(2) VIN is defined as VIN = AVIN = PVIN.
(3) V_TT load regulation is tested by using a 10 ms current pulse and measuring V_TT.
(4) Quiescent current defined as the current flow into AVIN.
(5) The maximum allowable power dissipation is a function of the maximum junction temperature, T_J(MAX), the junction to ambient thermal
resistance, θ_JA, and the ambient temperature, T_A. Exceeding the maximum allowable power dissipation will cause excessive die
temperature and the regulator will go into thermal shutdown.
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