CLP200M_03 Datasheet, PDF (8/21 Pages) STMicroelectronics – OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE

CLP200M
3. CLP200M TESTS RESULTS ACCORDING TO _{Fig. 11 : Power induction test circuit.}
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversal and longitudi-
nal modes as shown in figure 10.
1µF
R1
S2
1µF
100
S1 _R2
A
ITEM
UNDER
TEST
B_E
Fig. 10 : Transversal and longitudinal test
topologies.
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
15
ct(s) ^4kv
20µF
50
25
0.2µF
A or B
B or A
ITEM
UNDER
TEST
E
Vac(max) = 220V_RMS , with switch S in each posi-
tion and duration 15 min.
Fig. 12 : Power contact test circuit.
rodu TRANSVERSAL TEST
25
P ₁₅
te 25
A
ITEM
UNDER
B
TEST
le _4kv
20µF
50
0.2µF
o ^E
Obs _{LONGITUDINAL TEST}
<10
600
A
ITEM
UNDER
<10
TEST
600
BE
t(s) ^{- The test generator is the 10/700µs with 4kV of}
peak voltage.
duc 3.1.2. Power induction
ro ^{(Test 3a and 3b, table 2/K20)}
P _{Two kinds of tests using the same circuit topology}
te ^{(see fig.11) are defined in the CCITT K20.}
le ^{s Test 3a :}
Vac(max) = 300V_RMS, R1 = R2 = 600Ω
o _{S2 operating and test duration = 200 ms.}
Obs ^{s Test 3b :}
3.1.4. Acceptance criteria and number of tests
For the tests described in chapter 3.1.1., 3.1.2. and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
Vac(max) = 300V_RMS (*), R1 = R2 = 200Ω
mentioned in the table 1.
S2 operating and test duration not defined.
(*) Recommended value.
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