SI4430-B1 Datasheet, PDF (9/74 Pages) Silicon Laboratories – Si4430/31/32 ISM TRANSCEIVER

Si4430/31/32-B1
Table 3. Receiver AC Electrical Characteristics¹
Parameter
RX Frequency
Range—Si4431/32
RX Frequency
Range—Si4430
RX Sensitivity²
Symbol
F_RX
F_RX
P_{RX_2}
P_{RX_40}
P_{RX_100}
P_{RX_125}
P_{RX_OOK}
RX Channel Bandwidth³
BW
Conditions
(BER < 0.1%)
(2 kbps, GFSK, BT = 0.5,
f = 5 kHz)³
(BER < 0.1%)
(40 kbps, GFSK, BT = 0.5,
f = 20 kHz)³
(BER < 0.1%)
(100 kbps, GFSK, BT = 0.5,
f = 50 kHz)³
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
f = 62.5 kHz)
(BER < 0.1%)
(4.8 kbps, 350 kHz BW, OOK)³
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)³
Min Typ Max Units
240
—
930 MHz
900
—
960 MHz
— –121 — dBm
— –108 — dBm
— –104 — dBm
— –101 — dBm
— –110 — dBm
— –102 — dBm
2.6
—
620 kHz
BER Variation vs Power
Level³
P_{RX_RES}
Up to +5 dBm Input Level
—
LNA Input Impedance³
R_IN-RX
915 MHz
—
(Unmatched—measured
868 MHz
—
differentially across RX
input pins)
433 MHz
—
315 MHz
—
RSSI Resolution
RES_RSSI
—
1-Ch Offset Selectivity³ C/I_1-CH Desired Ref Signal 3 dB above sensitivity, —
2-Ch Offset Selectivity³
 3-Ch Offset Selectivity³
C/I_2-CH
C/I_3-CH
BER < 0.1%. Interferer and desired modu-
lated with 40 kbps F = 20 kHz GFSK with
BT = 0.5, channel spacing = 150 kHz
—
—
Blocking at 1 MHz Offset³ 1M_BLOCK Desired Ref Signal 3 dB above sensitivity. —
Blocking at 4 MHz Offset³
Blocking at 8 MHz Offset³
4M_BLOCK
8M_BLOCK
Interferer and desired modulated with
40 kbps F = 20 kHz GFSK with BT = 0.5
—
—
Image Rejection³
Im_REJ
Rejection at the image frequency.
—
IF=937 kHz
Spurious Emissions³
P_{OB_RX1}
Measured at RX pins
—
0
0.1
51–60j —
54–63j —
89–110j —
107–137j —
±0.5
—
–31
—
–35
—
–40
—
–52
—
–56
—
–63
—
–30
—
—
–54
ppm

dB
dB
dB
dB
dB
dB
dB
dB
dBm
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed
in the "Production Test Conditions" section on page 14.
2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required it is
recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for recommendations.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on page 14.
Rev 1.1
9