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SI510-11 Datasheet, PDF (5/26 Pages) Silicon Laboratories – 2 to 4 week lead times | |||
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Si510/511
Table 2. Output Clock Frequency Characteristics
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = â40 to +85 oC
Parameter
Nominal Frequency
Total Stability*
Symbol
FO
FO
Test Condition
CMOS, Dual CMOS
LVDS/LVPECL/HCSL
Frequency Stability Grade C
Min
Typ
Max
Unit
0.1
â
212.5 MHz
0.1
â
250
MHz
â30
â
+30
ppm
Frequency Stability Grade B
â50
â
+50
ppm
Temperature Stability
Frequency Stability Grade A
â100
â
+100
ppm
Frequency Stability Grade C
â20
â
+20
ppm
Frequency Stability Grade B
â25
â
+25
ppm
Startup Time
Disable Time
Enable Time
Frequency Stability Grade A
â50
â
+50
ppm
TSU
Minimum VDD until output
â
â
10
ms
frequency (FO) within specification
TD
FO ï³ 10 MHz
â
â
5
µs
FO < 10 MHz
â
â
40
µs
TE
FO ï³ 10 MHz
â
â
20
µs
FO < 10 MHz
â
â
60
µs
*Note: Total stability includes initial accuracy, operating temperature, supply voltage change, load change, shock and vibration
(not under operation), and 10 years aging at 40 oC.
Rev. 1.2
5
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