EZR32WG330 Datasheet, PDF (38/87 Pages) Silicon Laboratories – Building and home automation

EZR32WG330 Data Sheet
Electrical Specifications
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Offset error drift
OFFSET_ED
1.25 V reference
2.5 V reference
─
0.2²
0.7³
LSB/°C
─
0.2²
0.62³
LSB/°C
Note:
1. On the average every ADC will have one missing code, most likely to appear around 2048 +/- n*512 where n can be a value in
the set {-3, -2, -1, 1, 2, 3}. There will be no missing code around 2048, and in spite of the missing code the ADC will be monotonic
at all times so that a response to a slowly increasing input will always be a slowly increasing output. Around the one code that is
missing, the neighbour codes will look wider in the DNL plot. The spectra will show spurs on the level of -78 dBc for a full scale
input for chips that have the missing code issue.
2. Typical numbers given by abs(Mean) / (85 - 25).
3. Max number given by (abs(Mean) + 3x stddev) / (85 - 25).
The integral non-linearity (INL) and differential non-linearity parameters are explained in Figure 3.14 (p. 33) and Figure 3.15 (p. 33) ,
respectively.
Digital ouput code
4095
4094
4093
4092
INL=|[(VD-VSS)/VLSBIDEAL] - D| where 0 < D < 2^N - 1
Actual ADC
tranfer function
before offset and
gain correction
Actual ADC
tranfer function
after offset and
gain correction
INL Error
(End Point INL)
3
Ideal transfer
curve
2
1
VOFFSET
0
Analog Input
Figure 4.14. Integral Non-Linearity (INL)
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