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SI5365 Datasheet, PDF (3/18 Pages) Silicon Laboratories – PIN-PROGRAMMABLE PRECISION CLOCK MULTIPLIER
Si5365
Table 1. Performance Specifications (Continued)
(VDD = 1.8 or 2.5 V ±10%, TA = –40 to 85 ºC)
Parameter
Symbol
Test Condition
Min
Typ
Max Unit
Duty Cycle
PLL Performance
CKODC
45
—
55
%
Jitter Generation
JGEN
fOUT = 622.08 MHz,
—
LVPECL output format
50 kHz–80 MHz
0.6
TBD ps rms
12 kHz–20 MHz
—
0.6
TBD ps rms
Jitter Transfer
Phase Noise
JPK
CKOPN
fOUT = 622.08 MHz
100 Hz offset
—
0.05
0.1
dB
—
TBD
TBD dBc/Hz
1 kHz offset
—
TBD
TBD dBc/Hz
10 kHz offset
—
TBD
TBD dBc/Hz
100 kHz offset
—
TBD
TBD dBc/Hz
1 MHz offset
—
TBD
TBD dBc/Hz
Subharmonic Noise
SPSUBH Phase Noise @ 100 kHz
—
Offset
TBD
TBD dBc
Spurious Noise
SPSPUR
Max spur @ n x F3
—
(n > 1, n x F3 < 100 MHz)
TBD
TBD dBc
Package
Thermal Resistance
θJA
Junction to Ambient
Still Air
—
40
—
ºC/W
Note: For a more comprehensive listing of device specifications, please consult the Silicon Laboratories Any-Rate Precision
Clock Family Reference Manual. This document can be downloaded from www.silabs.com/timing.
Table 2. Absolute Maximum Ratings
Parameter
DC Supply Voltage
LVCMOS Input Voltage
Operating Junction Temperature
Storage Temperature Range
ESD HBM Tolerance (100 pF, 1.5 kΩ)
Symbol
VDD
VDIG
TJCT
TSTG
Value
–0.5 to 2.75
–0.3 to (VDD + 0.3)
–55 to 150
–55 to 150
2
Unit
V
V
ºC
ºC
kV
ESD MM Tolerance
200
V
Latch-Up Tolerance
JESD78 Compliant
Note: Permanent device damage may occur if the Absolute Maximum Ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operation sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods of time may affect device reliability.
Preliminary Rev. 0.34
3