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UG124 Datasheet, PDF (17/18 Pages) Silicon Laboratories – ZigBee Contact Sensor Reference Design Kit
UG124: ZigBee® Contact Sensor Reference Design (RD-0030-0201) Kit User's Guide
Manufacturing Tests
9.4 Test System Connection Procedure
Wire the system as indicated above. Both ISA3 adapters and the PC will be connected to the PoE hub. One ISA3 adapter will connect
to the DUT, to both reprogram and interact with the DUT, whereas the second ISA3 adapter will connect to the Golden Node for testing
network functionality. The ISA3 Adapters connected to the DUT should never be turned off. Instead, the DUT will be powered from the
Power Supply for live current measurements.
Within the shielded box the only items protruding inward should be the connectors linked to the DUT, the magnet and connectors for 50
Ω antennas. If desired, a spectrum analyzer may be procured and integrated into the system to measure frequency offset.
A controllable electro-magnet can be used to verify correct installation of the reed switch.
9.5 Configuring the ISA3 Adapters
For this setup, the PC will communicate to the ISA3 Adapter with an Ethernet connection over Telnet. To do this, first the ISA3 adapters
need to be configured to use a static IP address. For instructions on how to setup static IPs, reference Chapter 6.3 and 6.4 in Silicon
Labs' UG110: "Ember® EM35x Development User’s Guide". Use the Admin interface over USB to set up the ISA3 adapters.
9.6 Communicating with Targets
For testing purposes, the nodetest will be used. Through the telnet interface, both the ISA3 adapters and their respective connected
targets can be communicated with simultaneously. To communicate with the ISA3 adapters, a telnet session should be opened to its
static IP at port 4902. To communicate with a target connected to the ISA3 adapter though virtual UART, connect to the ISA3’s static IP
at port 4900.
Once connected, pressing Enter, or sending a ‘\r\n’ sequence will result in a prompt ending with a ‘>’ character.
9.7 Additional Details
For a more thorough checklist, refer to application note, AN700: "Manufacturing Test Guidelines for the Ember EM250, EM260, and
EM35x" or contact Silicon Labs (http://www.silabs.com) for additional information.
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