SI53119 Datasheet, PDF (17/35 Pages) Silicon Laboratories – 19-OUTPUT PCIE GEN 3 BUFFER

Si53119
3. Test and Measurement Setup
3.1. Input Edge
Input edge rate is based on single-ended measurement. This is the minimum input edge rate at which the Si53119
is guaranteed to meet all performance specifications.
Table 15. Input Edge Rate
Frequency
Min
100 MHz
0.35
133 MHz
0.35
Max
N/A
N/A
Unit
V/ns
V/ns
3.1.1. Measurement Points for Differential
+150 mV
Slew_rise
Slew_fall
+150 mV
0.0 V V_swing 0.0 V
-150 mV
Diff
Vovs
VHigh
Vrb
Figure 3. Measurement Points for Rise Time and Fall Time
-150 mV
Vrb
VLow
Vuds
Figure 4. Single-Ended Measurement Points for V_ovs, V_uds, V_rb
Rev. 1.1
17