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S-1004NA10I-M5T1U Datasheet, PDF (34/42 Pages) Seiko Instruments Inc – Release delay time accuracy
BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN
S-1004 Series
Rev.2.1_01
2. Change of detection voltage
If there is not a product with a specified detection voltage value in the S-1004 Series, the detection voltage can be
changed by using a resistance divider or a diode, as seen in Figure 41 to Figure 44.
In Figure 41 and Figure 42, hysteresis width also changes.
VDD
RA
VIN
RB
VDD
SENSE OUT
VSS CD
R
100 kΩ
VDD
RA
VIN
RB
VDD
SENSE OUT
VSS CD
GND
Figure 41 Detection voltage change
when using a resistance divider
(Nch open-drain output product)
Remark
Detection voltage =
RA + RB
RB
• −VDET
Hysteresis width =
RA + RB
RB
• VHYS
VDD
Vf1
VIN
VDD
SENSE OUT
VSS CD
R
100 kΩ
GND
Figure 42 Detection voltage change
when using a resistance divider
(CMOS output product)
VDD
Vf1
VIN
VDD
SENSE OUT
VSS CD
GND
Figure 43 Detection voltage change
when using a diode
(Nch open-drain output product)
GND
Figure 44 Detection voltage change
when using a diode
(CMOS output product)
Remark Detection voltage = Vf1 + (−VDET)
Caution 1.
2.
The above connection diagram and constant will not guarantee successful operation.
Perform thorough evaluation using the actual application to set the constant.
Set the constants referring to "2. 1 Error when detection voltage is set externally" in
" Operation".
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