NE5550279A Datasheet, PDF (3/9 Pages) Renesas Technology Corp – Silicon Power LDMOS FET

NE5550279A
TEST CIRCUIT SCHEMATIC FOR 460 MHz
VGS
VDS
IN
50 Ω
C10
C11
C12
L2
C13
R1
C1
L3
C14
FET
NE5550279A
L1
C1
L4
C20
C22
C21
OUT
50 Ω
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol
C1
C10
C11
C12
C13
C14
C20
C21
C22
R1
L1
L2
L3
L4
PCB
SMA Connecter
Value
1 μF
22 pF
1.2 pF
4.7 pF
15 pF
12 pF
10 pF
3.9 pF
100 pF
2 kΩ
123 nH
10 nH
9.8 nH
20 nH
−
−
Type
GRM188B31C105KA92
GRM1882C1H220JA01
ATC100A1R2JW
ATC100A4R7BW
ATC100A150BW
ATC100A120BW
ATC100A100JW
ATC100A3R9BW
ATC100A101JW
1/10 W Chip Resistor
RK73B1JTTD202J
φ 0.5 mm, φ D = 3 mm, 10 Turns
LQW18AN10NG00
φ 0.4 mm, φ D = 1.6 mm, 3 Turns
φ 0.5 mm, φ D = 3 mm, 2 Turns
R4775, t = 0.4 mm, εr = 4.5, size = 30 × 48 mm
WAKA 01K0790-20
Maker
Murata
Murata
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
American Technical
Ceramics
KOA
Ohesangyou
Murata
Ohesangyou
Ohesangyou
Panasonic
WAKA
COMPONENT LAYOUT OF TEST CIRCUIT FOR 460 MHz
C1
C12 L2
C13
C14
R1
C10
C11 ^L3
C1
L1
C21
C20 _C22
L4
R09DS0033EJ0100 Rev.1.00
Mar 28, 2012
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