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PD44165092B_15 Datasheet, PDF (16/37 Pages) Renesas Technology Corp – 18M-BIT QDRTM II SRAM 2-WORD BURST OPERATION
μPD44165092B, μPD44165182B, μPD44165362B
DC Characteristics 2 (TA = −40 to 85°C, VDD = 1.8 ± 0.1 V)
Parameter
Symbol
Test condition
Input leakage current
ILI
I/O leakage current
ILO
Operating supply current IDD
(Read cycle / Write cycle)
VIN ≤ VIL or VIN ≥ VIH,
II/O = 0 mA,
Cycle = MAX.
Standby supply current
(NOP)
Output HIGH voltage
Output LOW voltage
ISB1 VIN ≤ VIL or VIN ≥ VIH,
II/O = 0 mA,
Cycle = MAX.
Inputs static
VOH(Low) |IOH| ≤ 0.1 mA
VOH Note1
VOL(Low) IOL ≤ 0.1 mA
VOL Note2
-E33Y
-E35Y
-E40Y
-E50Y
-E33Y
-E35Y
-E40Y
-E50Y
MIN.
MAX.
Unit Note
X9 x18 x36
−2
+2
μA
−2
+2
μA
700 820 910 mA
680 790 890
640 740 830
570 670 730
430 440 470 mA
430 440 470
420 430 460
410 420 450
VDDQ−0.2
VDDQ/2−0.12
VDDQ
VDDQ/2+0.12
V 3, 4
V 3, 4
VSS
VDDQ/2−0.12
0.2
VDDQ/2+0.12
V 3, 4
V 3, 4
Notes 1. Outputs are impedance-controlled. | IOH | = (VDDQ/2)/(RQ/5) ±15% for values of 175 Ω ≤ RQ ≤ 350 Ω.
2. Outputs are impedance-controlled. IOL = (VDDQ/2)/(RQ/5) ±15% for values of 175 Ω ≤ RQ ≤ 350 Ω.
3. AC load current is higher than the shown DC values.
4. HSTL outputs meet JEDEC HSTL Class I standards.
R10DS0017EJ0200 Rev.2.00
October 6, 2011
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