BUK221-50DY Datasheet, PDF (10/16 Pages) NXP Semiconductors – Dual channel high-side TOPFET

Philips Semiconductors
BUK221-50DY
Dual channel high-side TOPFET™
8. Dynamic characteristics
Table 7: Switching characteristics
T_mb = 25 °C; V_BG = 13 V; resistive load R_L = 13 Ω per channel; Figure 12.
Symbol Parameter
Conditions
Turn-on measured from the input going HIGH
t_d(on)
turn-on delay time
dV/dt_on rising slew rate
t_on
turn-on switching time
Turn-off measured from the input going LOW
to 10 % V_L
30 to 70 % V_L
to 90 % V_L
t_d(off)
dV/dt_off
t_off
turn-off delay time
falling slew rate
turn-off switching time
to 90 % V_L
70 to 30 % V_L
to 10 % V_L
Min Typ Max Unit
-
30
0.5 1
-
60
-
µs
2
V/µs
220 µs
-
20
0.5 1
-
40
-
µs
2
V/µs
200 µs
Table 8: Capacitances
T_mb = 25 °C; f = 1 MHz; V_IG = 0 V.
Symbol Parameter
C_sg
status-ground capacitance
Per channel
C_ig
input-ground capacitance
C_bl
battery-load capacitance
Conditions
V_SG = 5 V
V_BG = 13 V
V_BL = 13 V
Min Typ Max Unit
-
11 15 pF
-
15 20 pF
-
130 180 pF
Table 9: Short circuit load protection characteristics
T_mb ≤ 125 °C prior to the overload short circuit condition.
Symbol Parameter
Conditions
Min Typ Max Unit
P_BL(OV)(th) battery-load overload power threshold 5.5 ≤ V_BG ≤ 35 V; device trips if ^[1] 10 55 100 W
t_BL(d)(sc)
battery-load short-circuit characteristic ^{PBL > PBL(OV)(th); Figure 11}
[2] _{200 350 800 µs}
time
[1] Short circuit protection is latched, but at high temperatures where T_j > T_j(th) overtemperature protection may occur first. Normal
operation may only be resumed following a short circuit after the input is toggled LOW then HIGH again.
[2] Short circuit response time t_d(sc) varies with battery-load power P_BL according to the logarithmic model equation:
t_d(sc) ≈ -_l-_n----_---_P-^t---^B_----B---^L---_L--⁽_-P--^d(----_O-_B)---⁽--_V-^s_-L---^c_--)--⁾_-(---_t---h----₎--_-
Table 10: Status response times
Limits are valid for −40 °C ≤ T_mb ≤ +150 °C and typical values for T_mb = 25 °C unless otherwise specified.
Symbol Parameter
Conditions
Min Typ
Measured from when the input goes LOW to when the status goes LOW
t_d(oc)
open-circuit response time
Figure 10 and 14
-
65
Max Unit
100 µs
9397 750 11167
Product data
Rev. 01 — 16 April 2003
© Koninklijke Philips Electronics N.V. 2003. All rights reserved.
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