74HC3GU04_15 Datasheet, PDF (10/17 Pages) NXP Semiconductors – Triple unbuffered inverter

NXP Semiconductors
74HC3GU04
Triple unbuffered inverter
R1
R2
U04
C1
C2
out
mna053
Test data is given in Table 11 and Table 12.
C1 = 47 pF (typical).
C2 = 22 pF (typical).
R1 = 1 M to 10 M (typical).
R2 optimum value depends on the frequency and required stability against changes in V_CC or average minimum I_CC
(I_CC = 2 mA at V_CC = 3.0 V and f = 1 MHz)
Fig 14. Crystal oscillator application
Table 11. External components for resonator (f < 1 MHz)
Frequency
R1
R2
10 kHz to 15.9 kHz
2.2 M
220 k
16 kHz to 24.9 kHz
2.2 M
220 k
25 kHz to 54.9 kHz
2.2 M
100 k
55 kHz to 129.9 kHz
2.2 M
100 k
130 kHz to 199.9 kHz
2.2 M
47 k
200 kHz to 349.9 kHz
2.2 M
47 k
350 kHz to 600 kHz
2.2 M
47 k
C1
56 pF
56 pF
56 pF
47 pF
47 pF
47 pF
47 pF
C2
20 pF
10 pF
10 pF
5 pF
5 pF
5 pF
5 pF
Table 12. Optimum value for R2
Frequency
R2
Optimum
3 kHz
6 kHz
10 kHz
14 kHz
> 14 kHz
2.0 k
minimum required I_CC
8.0 k
minimum influence due to change in V_CC
1.0 k
minimum required I_CC
4.7 k
minimum influence by V_CC
0.5 k
minimum required I_CC
2.0 k
minimum influence by V_CC
0.5 k
minimum required I_CC
2.0 k
minimum influence by V_CC
replace R2 by C3 = 35 pF (typical)
74HC3GU04
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 2 October 2013
© NXP B.V. 2013. All rights reserved.
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