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LC88FC2F0B Datasheet, PDF (16/47 Pages) ON Semiconductor – 16-bit Microcontroller 384K-byte Flash ROM / 24Kbyte RAM / 100-pin | |||
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LC88FC2F0B
Continued from preceding page.
Parameter
Symbol
Applicable Pin
/Remarks
Conditions
VDD [V] min
Specification
typ
max unit
Peak output
IOPL (1) Ports 0, 1, 3, 4
Per applicable pin
current
Ports 7, D
P20, P21, P24 to P27
15
PA0 to PA4, PA6, PA7
PB0 to PB4, PB6,
IOPL (2) P22, P23
Per applicable pin
PA4, PA5
20
PB4, PB5
IOPL (3) Ports 5, 6
Per applicable pin
PC0 to PC4
7.5
Average output IOML (1) Ports 0, 1, 3, 4
Per applicable pin
current
Ports 7, D
(Note 1-1)
P20, P21, P24 to P27
12.5
PA0 to PA4, PA6, PA7
PB0 to PB4, PB6, PB7
IOML (2) P22, P23
Per applicable pin
PA4, PA5
15
PB4, PB5
IOML (3) Ports 5, 6
Per applicable pin
PC0 to PC4
5
Total output
current
ïIOAL (1)
ïIOAL (2)
Ports 5
PC0 to PC2
Port 6
PC3 to PC4
Total of currents at
applicable pins
Total of currents at
applicable pins
10
mA
10
ïIOAL (3) Port 5, 6
Total of currents at
PC0 to PC4
applicable pins
20
ïIOAL (4) Ports 1, D
Total of currents at
P20, P21
applicable pins
35
ïIOAL (5) P22 to P27
Total of currents at
applicable pins
35
ïIOAL (6) Ports 1, 2, D
Total of currents at
applicable pins
70
ïIOAL (7) Port 4
Total of currents at
applicable pins
35
ïIOAL (8) Port 0, 3
Total of currents at
applicable pins
35
ïIOAL (9) Port 0, 3, 4
Total of currents at
applicable pins
70
ïIOAL (10) Port 7, B
Total of currents at
applicable pins
35
ïIOAL (11) Port A
Total of currents at
applicable pins
35
ïIOAL (12) Port 7, A, B
Total of currents at
applicable pins
70
Allowable power
Pd max TQFP100
Ta=ï40 to +85ï°C
dissipation
Package with thermal
resistance bord (Note
460 mW
1-2)
Operating ambient
Topr
temperature
Storage ambient
Tstg
temperature
ï40
+85
ï°C
ï55
+125
Note 1-1: Average output current refers to the average of output currents measured for a period of 100 ms.
Note 1-2: SEMI standerds thermal resistance board ( size : 76.1ï´ 114.3 ï´ 1.6 tmm, glass epoxy ) is used.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
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