MNSCAN18541T-X Datasheet, PDF (9/12 Pages) National Semiconductor (TI) – SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS

MNSCAN18541T-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC Parameters: SCAN TEST OPERATION(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP
11 IS GUARANTEED BUT NOT TESTED.
SYMBOL
tpLZ(4)
PARAMETER
Output Disable
Time
CONDITIONS
VCC=4.5V
During Test Logic Reset
tpHZ(4)
Output Disable
Time
VCC=4.5V
During Test Logic Reset
tpZL(2)
Output Enable
Time
VCC=4.5V
During Update-DR state
tpZH(2)
Output Enable
Time
VCC=4.5V
During Update-DR state
tpZL(3)
Output Enable
Time
VCC=4.5V
During Update-IR state
tpZH(3)
Output Enable
Time
VCC=4.5V
During Update-IR state
tpZL(4)
Output Enable
Time
VCC=4.5V
During Test Logic Reset
NOTES
PIN-
NAME
2, TCK to
4, 7 Data
Out
MIN
5.0
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 6.5
4, 7 Data
Out
2, TCK to 6.5
4, 7 Data
Out
2, TCK to 6.5
4, 7 Data
Out
2, TCK to 6.5
4, 7 Data
Out
2, TCK to 7.0
4, 7 Data
Out
2, TCK to 7.0
4, 7 Data
Out
MAX
19.9
UNIT
nS
SUB-
GROUPS
9
23.3 nS 10, 11
19.9 nS 9
23.3 nS 10, 11
18.9 nS 9
22.6 nS 10, 11
18.9 nS 9
22.6 nS 10, 11
22.4 nS 9
26.2 nS 10, 11
22.4 nS 9
26.2 nS 10, 11
23.8 nS 9
27.4 nS 10, 11
9