MNSCAN18541T-X Datasheet, PDF (8/12 Pages) National Semiconductor (TI) – SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS

MNSCAN18541T-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC Parameters: SCAN TEST OPERATION(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP
11 IS GUARANTEED BUT NOT TESTED.
SYMBOL
tpHL(3)
PARAMETER
CONDITIONS
Propagation Delay VCC=4.5V
During Update-IR state
tpLH(4)
Propagation Delay VCC=4.5V
During Test Logic Reset
tpHL(4)
Propagation Delay VCC=4.5V
During Test Logic Reset
tpLZ(2)
Output Disable
Time
VCC=4.5V
During Update-DR state
tpHZ(2)
Output Disable
Time
VCC=4.5V
During Update-DR state
tpLZ(3)
Output Disable
Time
VCC=4.5V
During Update-IR state
tpHZ(3)
Output Disable
Time
VCC=4.5V
During Update-IR state
NOTES
PIN-
NAME
2, TCK to
4, 7 Data
Out
MIN
5.0
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.5
4, 7 Data
Out
2, TCK to 5.5
4, 7 Data
Out
2, TCK to 5.5
4, 7 Data
Out
2, TCK to 5.5
4, 7 Data
Out
2, TCK to 4.0
4, 7 Data
Out
2, TCK to 4.0
4, 7 Data
Out
2, TCK to 4.0
4, 7 Data
Out
2, TCK to 4.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
MAX
18.6
UNIT
nS
SUB-
GROUPS
9
21.2 nS 10, 11
19.9 nS 9
23.0 nS 10, 11
19.9 nS 9
23.0 nS 10, 11
16.4 nS 9
19.6 nS 10, 11
16.4 nS 9
19.6 nS 10, 11
19.5 nS 9
22.4 nS 10, 11
19.5 nS 9
22.4 nS 10, 11
8