MNSCAN18541T-X Datasheet, PDF (11/12 Pages) National Semiconductor (TI) – SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS

MNSCAN18541T-X REV 1A0
MICROCIRCUIT DATA SHEET
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SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25 C & +125 C TEMPERATURE,
SUBGROUPS A1, 2, 7 & 8.
SAMPLE TESTED (MEHTOD 5005, TABLE 1) ON EACH MFG. LOT AT +25 C & +125 C TEMPERATURE,
SUBGROUPS A9 & 10.
TRANSMISSION LINE DRIVING TEST, GUARDBANDED LIMITS SET FOR +25 C, 2 MSEC DURATION
MAX.
GUARANTEED BUT NOT TESTED. (DESIGN CHARACTERIZATION DATA ONLY).
+25 C & +125 C MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MINIMUM LIMITS.
MAX NUMBER OF OUTPUTS DEFINED AS (N). DATA INPUTS ARE DRIVEN 0V TO 3V. ONE OUTPUT AT
VOL.
MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3V.
INPUT-UNDER-TEST SWITCHING: 3V TO THRESHOLD(VILD), 0V TO THRESHOLD(VIHD), FREQ =
1MHZ.
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