MNSCAN18541T-X Datasheet, PDF (1/12 Pages) National Semiconductor (TI) – SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS

MNSCAN18541T-X REV 1A0
MICROCIRCUIT DATA SHEET
Original Creation Date: 10/23/98
Last Update Date: 01/12/99
Last Major Revision Date: 11/30/98
SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE
DRIVER WITH TRI-STATE OUTPUTS
General Description
The SCAN18541T is a high speed, low-power line driver featuring separate data inputs
organized into dual 9-bit bytes with byte-oriented paired output enable control signals.
This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN
Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test
access port consisting of Test Data input (TDI), Test Data Out (TDO), Test Mode Select
(TMS), and Test Clock (TCK).
Industry Part Number
SCAN18541T
Prime Die
YJ541
Controlling Document
5962-93116
NS Part Numbers
SCAN18541TFMQB
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
1
Static tests at
2
Static tests at
3
Static tests at
4
Dynamic tests at
5
Dynamic tests at
6
Dynamic tests at
7
Functional tests at
8A
Functional tests at
8B
Functional tests at
9
Switching tests at
10
Switching tests at
11
Switching tests at
Temp ( ^oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
1