MNSCAN18541T-X Datasheet, PDF (7/12 Pages) National Semiconductor (TI) – SERIALLY CONTROLLED ACCESS NETWORK NON-INVERTING LINE DRIVER WITH TRI-STATE OUTPUTS

MNSCAN18541T-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC Parameters: SCAN TEST OPERATION(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C. NOTE: -55C TEMPERATURE, SUBGROUP
11 IS GUARANTEED BUT NOT TESTED.
SYMBOL
tpHL(1)
PARAMETER
Propagation Delay VCC=4.5V
CONDITIONS
tpZH(1)
Output Enable
Time
VCC=4.5V
tpZL(1)
Output Enable
Time
VCC=4.5V
tpHZ(1)
Output Disable
Time
VCC=4.5V
tpLZ(1)
Output Disable
Time
VCC=4.5V
tpLH(2)
Propagation Delay VCC=4.5V
During Update-DR state
tpHL(2)
Propagation Delay VCC=4.5V
During Update-DR state
tpLH(3)
Propagation Delay VCC=4.5V
During Update-IR state
NOTES
PIN-
NAME
2, TCK to
4, 7 TDO
MIN
3.5
2, TCK to 3.5
4, 7 TDO
2, TCK to 3.0
4, 7 TDO
2, TCK to 3.0
4, 7 TDO
2, TCK to 3.0
4, 7 TDO
2, TCK to 3.0
4, 7 TDO
2, TCK to 2.5
4, 7 TDO
2, TCK to 2.5
4, 7 TDO
2, TCK to 2.5
4, 7 TDO
2, TCK to 2.5
4, 7 TDO
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
2, TCK to 5.0
4, 7 Data
Out
MAX
13.2
UNIT
nS
SUB-
GROUPS
9
15.8 nS 10, 11
14.5 nS 9
17.0 nS 10, 11
14.5 nS 9
17.0 nS 10, 11
11.5 nS 9
13.2 nS 10, 11
11.5 nS 9
13.2 nS 10, 11
18.0 nS 9
21.7 nS 10, 11
18.0 nS 9
21.7 nS 10, 11
18.6 nS 9
21.2 nS 10, 11
7