ERB1885C2E100GDX5D Datasheet, PDF (9/20 Pages) Murata Manufacturing Co., Ltd. – Application Spec ifi c Capacitors High Frequency Ceramic Capacitors

A p p l i c at i o n S p e c i f i c Ca pa c i t o rs
High Frequency Ceramic Capacitors
ERB Specifications and Test Methods
Specifications and Test Methods
ERB Series
SIptecmifications and Test Methods
Specifications
Operating Temperature
᧩55°C to 125°C
Appearance
No defects or abnormalities.
Dimension
Within the specified dimensions.
Test Method
Reference Temperature: 25ഒ
Visual inspection.
Using calipers.
Dielectric Strength
No defects or abnormalities.
300%* of the rated voltage
*250V/300V: 250%, 500V: 200%
1,000,000Mȍmin.(Cู470pF)
Insulation Resistance
100,000 Mȍmin. (C᧺470pF)
C: Nominal capacitance (pF)
Cู220pF: Qฺ10,000
Q
Specifications
and
Test
220pF᧸Cู470pF: Qฺ5,000
M⁴⁷e^0pt^Fh^᧸od^Cูs^{1000pF: Qฺ3,000}
C: Nominal capacitance (pF)
OA^ATICTCt_ep^deep^ah_rp^hm^me^pa_me^er^arpa_aais^c_netⁱ_crⁱi^va_artn_ta^eae_tngi^nt_orc^SuicT_nser^tete^r_i^e_cmⁿ_sp^ge^thra^otu^f re
N^{᧩NdCWTWe}o^oea5fiimettpd5^rhhece°^apiimtnnCcf^ee^sirotttc^htahhaovt^oteens^auu1clrsso^l2eeodppr5^feeCCa^{o°tccSCbhcohiic}n^effepaiiueeo^fnetfrddr^eig.ccm^reettimoo:a^fnil^llicteeiⁿt^:i^rraae^aatts^innio.^{occneens..so((TTraaobbtllheeeAAr --11))}
Dimension
Dielectric Strength
Vibration Resistance
Insulation Resistance
WACpiatphpeianacrtiahtanencscepe: eNDcoirfiifdet:edWfedcitmthseinonr±sia0ob.n2ns%o. rmoralities.
C^±a⁰p^.5a^pc^Fita^(Wnc^heⁱ:^cW^hei^vth^ei^rn^isth^le^ars^gp^ee^r)cified tolerance.
N_Co_ู2d₂e₀fe_pc_Ft_:s_Qo_ฺr ₁a₀b_,n₀o₀r₀malities.
220pF᧸Cู470pF: Qฺ5,000
1₄,₇0₀0_p0_F,0_᧸0_C0M_ู1ȍ₀m₀₀in_p.(_FC_: ู_Q4_ฺ7₃0_,p₀F₀)₀
1_C0_: 0_N,0_o0_m0_inM_aȍ_{l c}m_apin_a._c(_iC_ta᧺_nc4_e70_(pp_FF₎)
C: Nominal capacitance (pF)
Deflection
C^Noู2^c2^ra0^cp^kF:^oQ^{r m}ฺ1^a0^rk,0^e0^d0^{defect should occur.}
Q
Solderability of Termination
220pF᧸Cู470pF: Qฺ5,000
4^9e7^5ve0^%np_lF^oyf᧸_athnC^edู^tc1^eo0^rnm0_t0_iinnp_uaF_ot:^iouQ^nsฺ_lsy3_.^a,0^re00^{to be soldered}
C: Nominal capacitance (pF)
DC voltage not exceeding the rated voltage at 25°C
and 75%RH max. and within 2 minutes of charging.
Frequency 1±0.1MHz
Voltage 1±0.2Vrms
ERB Series
STohledetermthpeecraatpuarecictoo^Tre^etfof^sict^tiheen^Mtt^eeiss^thdt je^oigt^de(rgmlainsesdeupsoinxgy the
Rbcoeaafperadrce)intahcnecnTeaempmpeplayesr1ua0rteuNdrefion: r2sc5teeഒpin3pasraallerel fweritehntchee. test
V^jiWsgi_ts_eh^fu_p^oea^rn1l¹i^ctn⁰_hys^±crp_o^1lie_u^snc_g^egt_h^ci^to^.h5n^e._{thteemcpaepraactuitraencseeqsuheonutlidallbyefrwomithin}
Uthseinsgpceacliifpieedrst.olerance for the temperature coefficient
Farnedquceanpcaycirtancgee,cfhraonmge10astoin5T5aHbzleaAn-d1r.eTthuern to
3_1c0_0a0_Hp%_za,c*_sito_haf_not_cuh_ele_ddr_ba_rieft_te_tid_rsav_vco_eal_lrt_csa_ueg_ldae_{tiendabpyprdoivxiidminagtetlhye1 minute.}
*_Td2_hi5_fifs0_eV_rme/_n3_oc0_tieo0_snV_b:_se2_ht5_ow0_ue%_lden,_b5_teh0_ea0_pV_mp:_al2_iex0_idm0%_{fuomr aapnedrmiodiniomf u2mhours}
in^me^eaa^sc^uh^reo^df 3^vam^luu^et^suaⁱⁿlly^stp^ee^pr^sp¹e^,n³di^acⁿu^dlar⁵d^bir^ye^tc^ht^eio^cn^as^pt^.otal of
D6^vC^ah^lo^uvu^eorlⁱsⁿta).^sg^te^epno³t^. exceeding the rated voltage at 25°C
and_S7_te5_p%RH max. and _Tw_eit_mhi_pn_e2_ram_tui_rn_eu₍t_°e_Cs₎ of charging.
F^Fr^lee^xq^uu^12re^en^: c¹y^m1^m±0.1MHz
25±2
-55±3
V_Imo_mlta_e3g_re_se1_i±_n0_e.2_uV_term_ctis_{c solder so}2_l5_u±_ti2_{on for 5±0.5 seconds}
at 24⁴5±5°C or Sn-3.0Ag-0.5C¹²u⁵s^±o³lder solution for
5±0.5⁵ seconds at 245±5°C. ^25±2
Adhesive Strength of
Termination
N^Apo^pr^ee^am^raoⁿva^cel o^: f^Nt^ohe^mt^ae^rr^kmⁱⁿin^ga^dti^eo^fn^es^cto^sr other
d^Ce^af^pe^ac^ct ⁱs^tahⁿo^cu^eld^Co^hc^acⁿu^gr.^{e: Within ±2.5% or}
±0.25 pF (Whichever is larger)
Resistance to Soldering Heat
Vibration Resistance
Cู220pF: Qฺ10,000
AC₂₂pa₀pp_pea_Fac_{᧸irtaanCnccู}ee₄::₇NW₀o_pitFdh_:ein_Qfet_ฺhc5tes_{,0so0pr0eacbifnieodrmtoalelitriaensc. e.}
C⁴⁷ู⁰2^p2^F0^᧸pF^C: ^ูQ¹à¸º⁰1⁰0⁰,^p0^F0^:0^Qฺ3,000
2^C2^: 0^Np^oF^m᧸ⁱⁿC^aู^l 4^c7^a0^pp^aF^ci:^taQⁿฺ^c5^e,0^(p0^F0⁾
4_A7_p0_pp_eF_a᧸_ranC_cู_e1_:0_N0_o0p_mF_a:_rQ_kiฺ_n3_g,0_d0_e0_fects
C_C:_aN_pao_cm_iti_an_na_cl_eca_Cp_ha_ac_nit_ga_en_:c_We (_itp_hF_in) _{±5% or}
D_Tee_mfle_pc_eti_ro_an_{ture Cycle}
Solderability of Termination
±0.5 pF (Whichever is larger)
N_Co_ู2c₂ra₀c_pk_F:o_Qr m_ฺ1a₀rk_,0e₀d₀defect should occur.
220pF᧸Cู470pF: Qฺ5,000
9e₄5v_7e%0nplFoyf_᧸athnCed_ูtc₁eo₀rnm_{0t0iinnpuaFot:}iou_Qns_ฺlsy3.a_,0re₀₀to be soldered
C: Nominal capacitance (pF)
Solder the capacitor to the test jig (glass epoxy
board) then apply 10N force in parallel with the test
j_Ii_mg _mfo_er_r1_s0_e±_t1_hs_ee_cc_a. _{pacitor in a eutectic solder solution or}
Sn-3.0Ag-0.5Cu solder solution at 270±5°C for
10±0.5 seconds. Let sit at room temperature for
F₂₄re_±q₂u_he_on_uc_ry_s.range, from 10 to 55Hz and return to
10Hz, should be traversed in approximately 1 minute.
This motion should be applied for a period of 2 hours
in each of 3 mutually perpendicular directions total of
6 hours).
F_᧩le₅x₅u_ഒre:_to1m₁₂m_{5ഒ Five cycles}
Immerse in eutectic solder solution for 5±0.5 seconds
at 245±5°C or Sn-3.0Ag-0.5Cu solder solution for
5±0.5 seconds at 245±5°C.
R_He_us_mis_idta_itn_yc_Se_teto_adS_yol_Sd_te_ar_ti_eng Heat
Appearance: No marking defects
Capacitance Change: Within ±2₅._%5%_oror
±0.2₅5_pFpF_(W(W_hich_hic_eh_ve_ev_re_ir_s i_ls_arla_gr_eg_re₎ r)
Cู2₃2₀0_pp_FF_: :_QQ_ฺฺ₃1₅0,000
2₁2₀0_pp_FF_ู᧸_C<C₃ู₀4_p7_F0_:p_QF_ฺ: ₂Q₇ฺ₅5₊,0₅0_°0_{C/2°C᧸10pF:}
4_Q7_ฺ0₂p₀F₀᧸₊₁C₀ู_C1000pF: Qฺ3,000
C: Nominal capacitance (pF)
Immerse the capacitor in a eutectic solder solution or
S_An_p-_p3_ly.0_tA_hg_e-₂0₄.5_-C_hou_us_ro_hld_ee_ar_{t (}s_-o₁l₀ut_ti_on₊₆a₅t _ഒ27₎0_a±_n5_d°C_hufo_mr_idity
1₍₈0₀±0_to.5₁s₀e₀c_%o₎nd_trs_e._atL_me_et _ns_ti_,t ₁a₀t r_co_oo_nm_sete_cm_utp_ive_era_tit_mur_ee_s.for
24±2 hours.
THeigmhpTeeramtupreeraCtuyrceleLoad
Appearance: No marking defects
Capacitance Change: Within ±53% or
±0.53ppFF((WWhhicichheevveerrisislalarrggeerr))
Cู23200ppFF: :QQฺฺ3150,000
21200ppFFู᧸C<C3ู04p7F0:pQFฺ: 2Q7ฺ55+,50°0C0/2°C
4᧸7100ppFF᧸: QCฺู12000+p1F0:°CQฺ3,000
C: Nominal capacitance (pF)
Apply 200% (500V only 150%) of the rated voltage
᧩for5150ഒ00t±o1122h5oഒurFsivaet tchyeclmesaximum operating
temperature ±3°C.
52 – Innovator in Electronics
Humidity Steady State
Appearance: No marking defects
Capacitance Change: Within ±5% or
±0.5pF (^Whichev^wer is^wlarge^wr) ^{. m u r a t a . c o m}

C-29-C
Cู30pF: Qฺ350
Apply the 24-hour heat (-10 to +65ഒ) and humidity
(80 to 100%) treatment, 10 consecutive times.