GQM1885C2A6R2DB01D Datasheet, PDF (4/29 Pages) Murata Manufacturing Co., Ltd. – CHIP MONOLITHIC CERAMIC CAPACITOR FOR GENERAL

■SPECIFICATIONS AND TEST METHODS
No
Item
16 Humidity
(Steady State)
Appearance
Capacitance
Change
Q/D.F.
I.R.
Temperature
Compensating Type
No defects or abnormalities.
Specification
High Dielectric
Constant Type
Within ±5% or± 0.5pF
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
(Whichever is larger)
F1,F5 :Within ±30%
30pF and over:Q≧350
ï¼»B1,B3,R1,R6,R7,C7,C8,L8ï¼½
10pF and over
W.V.:100V :0.05max.( C＜0.068mF)
30pF and below:Q≧275+5C/2
:0.075max.(C≧0.068mF)
10pF and below:Q≧200+10C W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
C:Nominal Capacitance(pF)
W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
More than 1,000MW or 50W·F(Whichever is smaller)
Test Method
Set the capacitor at 40±2℃ and in 90 to 95% humiduty
for 500±12 hours.
Remove and set for 24±2 hours at room temperature,
then measure.
17 Humidity Load
Appearance No defects or abnormalities.
Capacitance Within ±7.5% or±0.75pF
Change
(Whichever is larger)
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
F1,F5 :Within ±30%
[W.V.:10Vmax.]
F1 :Within+30/-40%
Q/D.F.
30pF and over:Q≧200
ï¼»B1,B3,R1,R6,R7,C7,C8,L8ï¼½
30pF and below:Q≧100+10C/3 W.V.:100V :0.05max.( C＜0.068mF)
:0.075max.(C≧0.068mF)
C:Nominal Capacitance(pF) W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 500MΩ or 25Ω·F(Whichever is smaller)
Apply the rated voltage at 40±2℃ and 90 to 95% humidity
for 500±12 hours. Remove and set for 24±2 hours at room
temprature, then muasure. The charge/discharge current
is less than 50mA.
• Initial measurement for F1/10Vmax.
Apply the rated DC voltage for 1 hour at 40±2℃.
Remove and set for 24±2 hours at room temperature.
Perform initial measurement.
18 High Temperature Appearance No defects or abnormalities.
Load
Capacitance Within ±3% or ±0.3pF
Change
(Whichever is larger)
B1,B3,R1,R6,R7,R9,C7,C8,L8:Within ±12.5%
F1,F5 :Within ±30%
[Except 35V,10Vmax and C≧1.0. mF]
F1 :Within+30/-40%
[35V, 10Vmax and C≧1.0. mF]
Q/D.F.
30pF and over:Q≧350
ï¼»B1,B3,R1,R6,R7,C7,C8,L8ï¼½
10pF and over
W.V.:100V :0.05max.( C＜0.068mF)
30pF and below: Q≧275+5C/2
:0.075max.(C≧0.068mF)
10pF and below:Q≧200+10C W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
C:Nominal Capacitance (pF) W.V.:6.3V/4V :0.075max.(C＜3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[F1,F5]
W.V.:25Vmin
:0.075max. (C＜0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 1,000MW or 50W·F(Whichever is smaller)
Table A
Nominal
Capacitance Change from 20C (%)
Char.
Values
-55
-25
-10
(ppm/C) *
Max.
Min.
Max.
Min.
Max.
Min.
2C/0C
0± 60
0.82
-0.45
0.49
-0.27
0.33
-0.18
3C
0±120
1.37
-0.90
0.82
-0.54
0.55
-0.36
4C
0±250
2.56
-1.88
1.54
-1.13
1.02
-0.75
2P
-150± 60
-
-
1.32
0.41
0.88
0.27
3P
-150±120
-
-
1.65
0.14
1.10
0.09
4P
-150±250
-
-
2.36
-0.45
1.57
-0.30
2R
-220± 60
-
-
1.70
0.72
1.13
0.48
3R
-220±120
-
-
2.03
0.45
1.35
0.30
4R
-220±250
-
-
2.74
-0.14
1.83
-0.09
2S
-330± 60
-
-
2.30
1.22
1.54
0.81
3S
-330±120
-
-
2.63
0.95
1.76
0.63
4S
-330±250
-
-
3.35
0.36
2.23
0.24
2T
-470± 60
-
-
3.07
1.85
2.05
1.23
3T
-470±120
-
-
3.40
1.58
2.27
1.05
4T
-470±250
-
-
4.12
0.99
2.74
0.66
3U
-750±120
-
-
4.94
2.84
3.29
1.89
4U
-750+250
-
-
5.65
2.25
3.77
1.50
1X +350 to -1000
-
-
-
-
-
-
* Nominal values denote the temperature coefficient within a range of 20C to 125C(for C)/ 150C(for 0C)/85C(for other TC).
Apply 200% of the rated voltage at the maximum
operating temperature±3℃ for 1000±12 hours.
Set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
ï½¥Initial measurement for high dielectric constant type.
Apply 200% of the rated DC voltage at the maximun operating
temperature ±3°C for one hour. Remove and set for
24±2 hours at room temperature.
Perform initial measurement.
JEMCGS-0001S
4