GNM314R61A105MA13D Datasheet, PDF (2/24 Pages) Murata Manufacturing Co., Ltd. – CHIP MONOLITHIC CERAMIC CAPACITOR GNM314R61A105MA13_ (1206, X5R, 1uF, 10Vdc)

■SPECIFICATIONS AND TEST METHODS
No
Item
1 Operating
Temperature Range
2 Rated Voltage
3 Appearance
4 Dimension
5 Dielectric Strength
6 Insulation
Resistance
7 Capacitance
Specification
Temperature
Compensating Type
Δ C : －55℃ to 125℃
High Dielectric Type
B1,F1 ：－25℃ to 85℃
R1,R7 ：－55℃ to 125℃
R6 ：－55℃ to 85℃
F5：－30℃ to 85℃
See the previous pages.
No defects or abnormalities.
Within the specified dimensions.
No defects or abnormalities.
More than 10,000MΩ or 500Ω ∙F
(whichever is smaller)
Within the specified tolerance.
Test Method
Standard Temperature : 20℃
(5C,R6,R7,F5 : 25℃)
The rated voltage is defined as the maximum voltage which may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V^P-P or V^O-P,
whichever is larger, should be maintained within the rated voltage
range.
Visual inspection.
Using calipers.
No failure should be observed when 300% of the rated voltage
(temperature compensating type) or 250% of the rated voltage
(high dielectric constant type) is applied between the terminations
for 1 to 5 seconds, provided the charge/discharge current is less
than 50mA.
The insulation resistance should be measured with a DC voltage
not exceeding the rated voltage at 20/25℃ and 75%RH max.
and within 2 minutes of charging, provided the charge/discharge
current is less than 50mA.
The capacitance/D.F. should be measured at 20/25℃ at the
frequency and voltage shown in the table.
8 Q/Dissipation
Factor (D.F.)
9 Capacitance No bias
Temperature
Characteristics
50% of
the rated
voltage
Capacitance
Drift
10 Adhesive Strength
of Termination
30pF and over:Q≧1000
ï¼»B1,R1,R6,R7ï¼½
30pF and below:Q≧400+20C W.V.: 25Vmin. :0.025max.
W.V.:16V :0.035max.
C:Nominal Capacitance(pF) W.V.:6.3V :0.05max.
[F1,F5]
W.V.:25Vmin : 0.05max.
W.V.:16V : 0.07max.
Within the specified
tolerance.(Table A-1,A-2)
B1 : Within ±10%
(-25℃ to +85℃)
R1,R7 : Within ±15%
(-55℃ to +125℃)
R6 : Within ±15%
(-55℃ to +85℃)
F1 : Within +30/-80%
(-25℃ to +85℃)
F5 : Within +22/-82%
(-30℃ to +85℃)
Within±0.2% or±0.05pF
(Whichever is larger.)
B1 : Within +10/-30%
R1 : Within +15/-40%
F1 : Within +30/-95%
No removal of the terminations or other defect
should occur.
Char.
Item
Frequency
Voltage
2C,5C
1±0.1MHz
0.5 to 5Vrms
B1,R1,R6,R7,F1,F5
1±0.1kHz
1.0±0.2Vrms
The capacitance change should be measured after 5min. at each
specified temp.stage.
(1)Temperature Compensating Type
The temperature coefficient is determind using the capacitance
measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5, the capacitance should be within the specified tolerance for
the temperature coefficient and capacitance change as Table A-1,A-2.
The capacitance drift is caluculated by dividing the differences
between the maximum and minimum measured values in the step
1,3 and 5 by the cap.value in step 3.
(2)High Dielectric Constant Type
The ranges of capacitance change compared with the 20℃/25℃
value over the temperature ranges shown in the table should be
within the specified ranges.
Step
Temperature(C)
1
20±2/25±2
-55±3(for R1,R6,R7)/
2
-25±3(for B1,F1)/
-30±3(for F5)
3
20±2/25±2
4
125±3(for R1,R7)/
85±3(for B1,R6,F1,F5)
5
20±2
6
-55±3(for R1)/
-25±3(for B1,F1)
7
20±2
8
125±3(for R1)/
85±3(for B1,F1)
Applying
Voltage(V)
No bias
50% of the
rated voltage
Initial measurement for high dielectric constant type
Perform a heat treatment at 150 +0/-10°C for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measure-ment.
Solder the capacitor on the test jig (glass epoxy board)shown in
Fig.3 using a eutectic solder. Then apply 5N force in parallel
with the test jig for 10±1sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
JEMCCS-0001K
2