GCM21BR72A104KA37L Datasheet, PDF (17/44 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors for Automotive

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No.
AEC-Q200
Test Item
Specifications
Temperature Compensating Type
High Dielectric Type
Capacitance Within the specified tolerance
Change (Table A)
Temperature Within the specified tolerance
Coefficient (Table A)
C7: Within ±22%
(-55°C to +125°C)
R7: Within ±15%
(-55°C to +125°C)
Capacitance
21
Temperature
Character-
istics
Capacitance
Drift
Within ±0.2% or ±0.05 pF
(Whichever is larger)
* Do not apply to 1X/25V
*1: The figure indicates typical specification. Please refer to individual specifications.
AEC-Q200 Test Method
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
The temperature coefficient is determined using the capacitance
measured in step 3 as a reference. When cycling the
temperature sequentially from step1 through 5 (∆C: +25°C to
+125°C: other temp. coeffs.: +25°C to +85°C) the capacitance
should be within the specified tolerance for the temperature
coefficient and capacitance change as shown in Table A. The
capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
Step
1
2
3
4
5
Temperature (°C)
25±2
-55±3
25±2
125±3
25±2
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above
25°C value over the temperature ranges shown in the table
should be within the specified ranges.
· Initial measurement for high dielectric constant type.
Perform a heat treatment at 150+0/-10°C for one hour and then
set for 24±2 hours at room temperature.
Perform the initial measurement.
Table A
Char.
5C
Nominal Values (ppm/°C) Note1
0T30
-55
Max.
Min.
0.58
-0.24
Capacitance Change from 25°C (%)
-30
Max.
Min.
0.40
-0.17
Note 1: Nominal values denote the temperature coefficient within a range of 25°C to 125°C (for 5C).
-10
Max.
Min.
0.25
-0.11
18