MT44K32M18 Datasheet, PDF (45/111 Pages) Micron Technology – 576Mb: x18, x36 RLDRAM 3

Advance
576Mb: x18, x36 RLDRAM 3
AC Electrical Characteristics
Table 27: AC Electrical Characteristics (Continued)
Notes 1–7 apply to entire table
Parameter
CTRL, CMD,
ADDR,
hold from
CK,CK#
Base
(specification)
V_REF
@ 1 V/ns
Minimum CTRL, CMD, ADDR
pulse width
Row cycle time
Refresh rate
Sixteen-bank access window
Multibank access delay
WRITE-to-READ to same ad-
dress
Mode register set cycle time
to any command
READ training register mini-
mum READ time
READ training register burst
end to mode register set for
training register exit
ZQCL: Long POWER-UP and
calibration RESET operation
time
Normal operation
ZQCS: Short calibration time
Begin power-supply ramp to
power supplies stable
RESET# LOW to power sup-
plies stable
RESET# LOW to I/O and R_TT
High-Z
Symbol
t_IH(DC100)
RL3–2133
Min Max
65
–
RL3–1866
Min Max
100
–
RL3–1600
Min Max
120
–
165
–
200
–
220
–
t_IPW
470
–
535
–
560
–
t_RC
t_REF
t_SAW
t_MMD
t_WTR
t_MRSC
See minimum ^tRC values in the RL3 Speed Bins table.
64
–
64
–
64
–
8
–
8
–
8
–
2
–
2
–
2
–
WL +
–
WL +
–
WL +
–
BL/2
BL/2
BL/2
12
–
12
–
12
–
t_RTRS
2
–
2
–
2
–
t_RTRE
1
–
1
–
1
–
Calibration Timing
t_ZQinit
512
–
512
–
512
–
t_ZQoper
256
–
256
–
256
–
t_ZQcs
64
–
64
–
64
–
Initialization and Reset Timing
t_VDDPR
–
200
–
200
–
200
t_RPS
–
200
–
200
–
200
t_IOz
–
20
–
20
–
20
Units
ps
ps
ps
ns
ms
ns
CK
ns
CK
CK
CK
CK
CK
CK
ms
ms
ns
Notes
28, 30
19, 30
20
21
33
32
31
Notes:
1. Parameters are applicable with 0°C ≤ T_C ≤ +95°C; +1.28V ≤ V_DD ≤ +1.42V, +2.38V ≤ V_EXT ≤
+2.63V, +1.14V ≤ V_DDQ ≤ 1.26V.
2. All voltages are referenced to V_SS.
3. The unit ^tCK(avg) represents the actual ^tCK(avg) of the input clock under operation. The
unit CK represents one clock cycle of the input clock, counting the actual clock edges.
4. AC timing and I_DD tests may use a V_IL-to-V_IH swing of up to 900mV in the test environ-
ment, but input timing is still referenced to V_REF (except ^tIS, ^tIH, ^tDS, and ^tDH use the
AC/DC trip points and CK,CK# and DKx, DKx# use their crossing points). The minimum
slew rate for the input signals used to test the device is 1 V/ns for single-ended inputs
and 2 V/ns for differential inputs in the range between V_IL(AC) and V_IH(AC).
PDF: 09005aef84003617
576mb_rldram3.pdf – Rev. B 1/12 EN
45
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.