5989-8853EN Datasheet, PDF (27/37 Pages) Keysight Technologies – A guide to power product solutions to match your test and measurement needs

27 | Keysight | Power Products – October 2015 - Selection Guide
Semiconductor Device Analyzer
Keysight B1500A Semiconductor
Device Analyzer of Precision Cur-
rent-Voltage Analyzer Series is an
all in one analyzer supporting IV, CV,
pulse/dynamic IV and more, which is
designed for all-round characterization
from basic to cutting-edge appli-
cations. It provides a wide range of
measurement capabilities
to cover the electrical characterization
and evaluation of devices, materials,
semiconductors, active/passive com-
ponents, or virtually any other type of
electronic device with uncompromised
measurement reliability and eficiency.
In addition, the B1500A’s modular
architecture with ten available slots
allows you to add or upgrade measure-
ment modules if your measurement
needs change over time.
Keysight EasyEXPERT group+ GUI
based characterization software
is available either on the B1500A’s
embedded Windows 7 platform with
15-inch touch screen or on your PC to
accelerate the characterization tasks.
It supports eficient and repeatable
device characterization in the entire
characterization process from measure-
ment setup and execution to analysis
and data management either interactive
manual operation or automation across
a wafer in conjunction with a semi-
automatic wafer prober. EasyEXPERT
group+ makes it easy to perform com-
plex device characterization immediate-
ly with hundreds of ready-to-use mea-
surements (application tests) furnished,
and allows you the option of storing test
condition and measurement data auto-
matically after each measurement in a
unique built-in database (workspace),
ensuring that valuable information is
not lost and that measurements can
be repeated at a later date. Keysight
B1500A provides the complete solution
for device characterization with these
versatile capabilities.
B1500A
Test coverage
For DC and pulsed IV
measurement
For capacitance
measurement
For ultra-fast pulsed
and transient IV
measurement
For pulse generation
For ultra-fast pulsed
high-k/SOI evaluation
Supported module
B1510A High Power Source/
Measure Unit (HPSMU)
B1511B Medium Power
Source/Measure Unit (MPSMU)
Key speciications
– Up to 200 V/1 A
– Min 10 fA/2 μV resolution
– Up to 100 V/0.1 A
– Min 10 fA/0.5 μV
resolution
– Optional ASU for 0.1 fA and
IV/CV switching
B1517A High Resolution
Source/Measure Unit (HRSMU)
– Up to 100 V/0.1 A
– Min 1 fA/0.5 μV resolution
– Optional ASU for 0.1 fA and
IV/CV switching
B1514A 50 μs Pulse Medium
Current Source/Measure Unit
(MCSMU)
B1520A Multi-Frequency
Capacitance Measurement Unit
(MFCMU)
B1530A Waveform Generator/
Fast Measurement Unit
(WGFMU)
B1525A High Voltage
Semiconductor Pulse Generator
Unit (HV-SPGU)
B1542A 10 ns Pulsed IV
parametric test solution
– Up to 30 V/1 A (0.1 A DC)
– 1 kHz to 5 MHz frequency
range
– 25 V built-in DC bias and
100 V DC bias with SMU
and SCUU
– 10 ns programmable
resolution for waveform
generation
– 200 MSa/s simultaneous
high-speed measurement
– 10 V peak-to-peak output
– Up to ± 40 V high voltage
output
– Min 10 ns gate pulse width
with 2 ns rise and
fall times
– 1 μs current
measurement
resolution
Key features
– Min 100 μs
Sampling (time
domain)
measurement
– Min 500 μs pulse
width with 100 μs
resolution
– Quasi-static
capacitance
voltage (QSCV)
measurement
with leakage
current
compensation
– 4 quadrant operation
– Kelvin (4-wire) connection
– Spot, sweep and other
capabilities
– Min 50 μs pulse width with 2 μs resolution
– Oscilloscope view for precision pulsed measurement
– AC impedance measurement
(C-V, C-f, C-t)
– Easy, fast and accurate IV and CV
measurements with automated
switching via SCUU
– No load line effects; accurate pulsed IV measurement using
SMU-based technology
– Enabled for advanced applications, such as NBTI/PBTI,
RTN, etc.
– Two-level and three-level pulsing and arbitrary waveform
generation
capability on each channel
– Ideal for non-volatile memory testing
– Accurate Id-Vd and Id-Vg
measurement
– Easy switching between DC and pulsed measurements