ISL12022M Datasheet, PDF (5/27 Pages) Intersil Corporation – Real Time Clock with Embedded Crystal, ±5ppm Accuracy

ISL12022M
I²C Interface Specifications Test Conditions: V_DD = +2.7 to +5.5V, Temperature = -40°C to +85°C,
unless otherwise specified. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
(Note 10) (Note 6) (Note 10) UNITS
t_SU:STO
t_HD:STO
t_DH
t_R
t_F
Cb
STOP Condition Setup Time
From SCL rising edge
600
crossing 70% of V_DD, to SDA
rising edge crossing 30% of
V_DD.
STOP Condition Hold Time
From SDA rising edge to
600
SCL falling edge. Both
crossing 70% of V_DD.
Output Data Hold Time
From SCL falling edge
0
crossing 30% of V_DD, until
SDA enters the 30% to 70%
of V_DD window.
SDA and SCL Rise Time
From 30% to 70% of V_DD. 20 + 0.1 x Cb
SDA and SCL Fall Time
From 70% to 30% of V_DD. 20 + 0.1 x Cb
Capacitive Loading of SDA or SCL Total on-chip and off-chip
10
ns
ns
ns
300
ns
300
ns
400
pF
R_PU
SDA and SCL Bus Pull-up Resistor Maximum is determined by
1
kΩ
Off-chip
t_R and t_F.
For Cb = 400pF, max is about
2kΩ~2.5kΩ.
For Cb = 40pF, max is about
15kΩ~20kΩ
NOTES:
3. Temperature Conversion is inactive below V_BAT = 2.7V. Device operation is not guaranteed at V_BAT <1.8V.
4. IRQ/F_OUT inactive.
5. V_DD > V_BAT +V_BATHYS
6. Specified at +25°C.
7. In order to ensure proper timekeeping, the V_{DD SR-} specification must be followed.
8. Limits should be considered typical and are not production tested.
9. These are I²C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate
specification.
10. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
characterization and are not production tested.
NOTES
8, 9
8, 9
8, 9
8, 9
5
FN6668.4
December 18, 2008